The invention relates to a highly-doped pointed
electrode SOI piezoresistive
pressure sensor and a manufacturing method thereof, namely a piezoresistive
pressure sensor. The piezoresistive
pressure sensor solves the problems that the length of a
metal electrode is longer and the reliability of products is lowered through utilizing in high temperature. A SOI diaphragm is formed by a
silicon substrate, a first
silicon dioxide layer and a highly-doped layer. A thin
silicon layer, a second silicon layer and a
silicon nitride layer are arranged on the outer portion of the piezoresistive pressure sensor from inside to outside in turn. An
electrode is bonded with the highly-doped layer through the upper three
layers, and the silicon substrate and the lower three
layers are corroded to form a bottom groove. The manufacturing method comprises the flowing steps in turn: injecting heavy
boron in the SOI diaphragm,
etching to form a highly-doped area Q and a sensitive resistance R, secondarily oxygenizing, generating
silicon nitride, and then, making a lead wire and
etching the bottom groove, and finally, finishing the conventional process. The sensitive
resistor and the lead wire are made through adopting a highly-doped technique, independent high
doping is not needed to be done on the extraction portion of an electrode to do
ohmic contact, and meanwhile, an annealing process is reduced, the production cost is lowered, and the reliability of products is improved.