Equipment testability strategy optimization method and device

An optimization method and testable technology, applied in design optimization/simulation, genetic law, radio wave measurement system, etc., can solve the problems of single optimization target, easy to fall into local convergence, etc., to prevent premature phenomenon, prevent falling into partial convergence, Test the effect of low cost

Pending Publication Date: 2021-04-30
BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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Problems solved by technology

[0005] This application provides a method and device for equipment testability strategy optimization, storage media and electronic equipment, to at least solve the problem in the related art that the existing equipment testability optimization process has a single optimization goal and is easy to fall into local convergence.

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  • Equipment testability strategy optimization method and device
  • Equipment testability strategy optimization method and device
  • Equipment testability strategy optimization method and device

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Embodiment Construction

[0032] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of this application.

[0033]It should be noted that the terms "first" and "second" in the specification and claims of the present application and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such t...

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Abstract

The invention provides an equipment testability strategy optimization method and device, and the method comprises the steps of obtaining a test population which comprises a plurality of test sets for testing equipment; determining the test cost, the basic reliability cost and the testability performance benefit of the equipment based on the test population; taking the test cost and the basic reliability cost as first constraint parameters, and taking the testability performance benefit as a first test index to construct a first testability optimization model; and / or, taking the test cost, the basic reliability cost and the testability performance benefit as second constraint parameters, and taking the equipment comprehensive benefit as a second test index to construct a second testability optimization model; and performing testability strategy optimization calculation by adopting a fitness function based on the first testability optimization model and the second testability optimization model. According to the invention, the problems of single optimization target and easiness in falling into local convergence in the existing equipment testability optimization process in related technologies are solved.

Description

technical field [0001] The present application relates to the technical field of testability optimization, in particular to a method and device for equipment testability strategy optimization. Background technique [0002] For complex electronic systems, such as radar equipment, it is also necessary to select appropriate test nodes and test parameters for its testing and diagnosis. Due to the complex structure of the system, the relationship between faults, nodes and test parameters is difficult to obtain through mathematical derivation or simulation. Correlation model, research optimization strategy based on correlation model. In addition, testability optimization design is a process that comprehensively considers function, performance and reliability constraints. It is necessary to consider the trade-off and optimization of testability design from an overall perspective. Radar equipment can adopt an optimization strategy based on combined costs. [0003] Most of the exis...

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Application Information

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IPC IPC(8): G06F30/27G06N3/12G01S7/40G06F111/04
CPCG06F30/27G06N3/126G01S7/40G06F2111/04
Inventor 刘丽亚厚泽闫俊锋潘国庆徐睿倘亚朋
Owner BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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