Over-temperature protection circuit of bipolar linear voltage regulator

Abstract

The invention discloses an over-temperature protection circuit of a bipolar linear voltage regulator and belongs to the field of over-temperature protection. The over-temperature protection circuit of the bipolar linear voltage regulator is composed of a temperature sensor circuit, a sampling feedback circuit and an output circuit. According to the over-temperature protection circuit of the bipolar linear voltage regulator, the current feedback loop is introduced, so the circuit has a temperature hysteresis characteristic, problems that the protected circuit is frequently started at a temperature protection point, the junction temperature of a chip cannot be fully reduced and the circuit cannot return to a normal working state are solved, and the over-temperature protection circuit is suitable for low power supply voltage; by adopting the over-temperature protection circuit disclosed by the invention, whether the junction temperature of the bipolar linear voltage regulator and other analog circuit chips exceeds a safe working area or not can be accurately identified. The circuit is designed and realized by adopting a bipolar process, the circuit structure is simple, the number of used components is small, and the physical design area is small.

Description

technical field [0001] The invention belongs to the field of over-temperature protection, in particular to an over-temperature protection circuit of a bipolar linear regulator. Background technique [0002] A linear voltage regulator is a low-power monolithic miniature power system that is an important part of today's electronic systems. In order to follow the rapid development of system-on-chip technology to low-voltage, high-speed, and high-density integration, voltage regulators are developing in the direction of high power density, high integration, low voltage output, and fast load transient response. Whether the voltage stabilizer can work stably and reliably has become an important factor in the evaluation of circuit performance. In order to prevent problems caused by harsh environments and sudden fault conditions, it is required to consider the design of protection circuits when designing circuit systems, which has become a power system. The integrated circuit is a ...

AI Technical Summary

Problems solved by technology

In linear regulators, different users have different applications, resulting in large differences in power consumption of the chip itself, resulting in different junction temperatures of the chip; research shows that for every 2°C increase in chip temperature, the reliability will decrease by 10%, and the temperature will increase by 50%. °C, the working life is only 1 / 6 of that when the temperature rises by 25 °C

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