The invention relates to the technical field of electronic measurement, in particular to a low-common-mode bipolar edge-control constant-current excitation low-value resistance testing method. The low-common-mode bipolar edge-control constant-current excitation low-value
resistor testing device comprises a bipolar edge-control
voltage module, a constant-current control module, a low-common-
mode excitation module, a tested
resistor and a sampling end module, the method comprises the steps that S1, a DAC
voltage source of a bipolar edge control
voltage module provides a
bipolar voltage source Vdac with an edge
control function; s2, the output voltage Vref of the bipolar edge control voltage module is connected with a
constant current control module; s3, the excitation output low end of the
constant current control module is connected with a low common
mode excitation module; s4, the excitation output low end and the excitation output high end of the low common
mode excitation module are connected with the tested
resistor through a test cable; and S5, the induction high end and the induction low end of the test cable are connected with a sampling end module. According to the invention, the edge control technology and the
constant current excitation technology are combined, and low-common-mode and high-precision low-value resistance measurement is realized.