Method for processing measured data of multispectral radiation thermometer

A technology of radiation thermometer and measurement data, which is applied in the field of multi-spectral radiation measurement data processing to achieve high-precision results

Inactive Publication Date: 2022-04-12
天合(无锡)仪器有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Aiming at the problem that the existing multispectral radiation thermometer data processing method is only suitable for a small number of materials, the present invention provides a multispectral radiation thermometer measurement data processing method applicable to most materials

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  • Method for processing measured data of multispectral radiation thermometer
  • Method for processing measured data of multispectral radiation thermometer
  • Method for processing measured data of multispectral radiation thermometer

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Embodiment Construction

[0021] Next, the technical solutions in the embodiments of the present invention will be described in connection with the drawings of the embodiments of the present invention, and it is understood that the described embodiments are merely the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by those of ordinary skill in the art without creative labor are in the scope of the present invention.

[0022] It should be noted that the features of the present invention in the present invention may be combined with each other in the case of an unable conflict.

[0023] The present invention will be further described below with reference to the accompanying drawings and specific examples, but is not limited as the invention.

[0024] During the multi-spectral radiation thermometer measurement data processing, set the fitting curve y = a 0 + a 1 X + ... + a m x m The number of T = M + 1, the s...

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Abstract

The invention discloses a method for processing measured data of a multispectral radiation thermometer, solves the problem that an existing data processing method of the multispectral radiation thermometer is only suitable for a few materials, and belongs to the technical field of spectral data processing. The invention relates to a method for processing measured data of a multispectral radiation thermometer. The method comprises the following steps: S1, acquiring measured data xk of the multispectral radiation thermometer and a corresponding real temperature yk; s2, according to xk and yk, fitting by using y = a0 + a1x +... + amxm to obtain a residual error sum of squares Q; s3, removing the mth term, and fitting by using y = a0 + a1x +... + am-1xm-1 to obtain a residual error sum of squares Q '; and S4, acquiring a variance ratio Fm according to the Q and the Q ', judging whether the Fm is greater than a critical value Falpha, if so, determining that m is equal to m + 1, and turning to S2, otherwise, according to the value of the current m, adopting y = a0 + a1x +... + am-1xm-1 as a fitting curve model of the measurement data of the multispectral radiation thermometer.

Description

Technical field [0001] The present invention relates to a multi-spectral radiation measurement data processing method, which belongs to the field of spectral data processing. Background technique [0002] For data processing of multi-spectral radiation thermometer, the least squares method is used, which must assume the functional relationship between the transmitrage and the wavelength, otherwise it cannot be solved. When assuming model is consistent with the actual situation, the actual temperature and material emissivity of the resulting object will be very good with the actual situation; when the two are inconsistent, the actual temperature and material emissivity of the obtained object and the actual situation Very different. The existing multi-spectrometry algorithm is assumed to be the relationship between emissivity ε and wavelength x: lnε = a + bx or lnε = a 0 + a 1 X + ... + a n x n These two hypothetical relationships are only suitable for minority, can solve the true ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/20G06F17/10G01J5/00
Inventor 于天河戴景民
Owner 天合(无锡)仪器有限公司
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