File conversion system and file conversion method

Abstract

The invention relates to a file conversion system and a file conversion method. The file conversion method comprises the following steps: automatically obtaining file conversion data containing a test mode to be converted; carrying out file conversion so as to convert the test mode to be converted into a format of a target test mode; renaming the target test mode after the file conversion; compiling the target test mode; and storing the renamed target test mode. The file change system comprises a file conversion server and at least one test machine for testing a wafer, wherein the file conversion server is used for automatically obtaining the file conversion data containing the test mode to be converted, converting the test mode to into the target test mode, renaming the target test mode, compiling the target test mode and storing the renamed target test mode. The invention ensures that file conversion steps can be simplified, unified and automatically operated completely. A test module after the file conversion can be repeatedly used so as to reduce man-made careless mistakes and staff for extra hour work, improve the working efficiency, reduce mass-production preparation time, have high system extendibility and reduce the relevant cost.

Description

technical field [0001] The present invention relates to a shifting system and a shifting method thereof, in particular to a simplified and unified shifting step, which can be fully automated, and the target test module after shifting can be reused, reducing human error and improving work The conversion system and the conversion method in the semiconductor testing field have high efficiency and high system scalability and can reduce related costs. Background technique [0002] In the field of semiconductor testing, a testing system such as a probe card system is usually used, and its precise contact mechanism is in contact with the wafer to be tested to form an electrical path and perform the test. Wherein, the semiconductor test system transmits the test pattern to a test interface, and then transfers it to the probe card and successively contacts the chips to be tested on the wafer, and then transmits the test pattern back through the same path. This test interface can als...

AI Technical Summary

Problems solved by technology

Such a file conversion program is quite time-consuming. For example, based on the calculation of testing 10 products (including different software codes of the same product) every day, it takes about three or four hours a day for file conversion; Due to the requirement of file transfer, the engineer in charge must work overtime to meet customer needs

In addition, it often happens that when receiving the goods to be tested from the customer, there is no test mode to test because the staff is absent and cannot transfer files; Unable to obtain the test mode, resulting in delays in product delivery, or even testing in the wrong test mode and causing customer claims

In addition to the long conversion time, too many conversion steps, difficult handover, and error-prone, other disadvantages of the above-mentioned conversion procedures include the variety of types that must be converted, human error prone to occur, and the lead time for mass production is too long, etc. and other defects

[0007] It can be seen that the above-mentioned existing shifting system and shifting method thereof obviously still have inconvenience and defects in shifting method, product structure and use, and need to be further improved urgently

In order to solve the above-mentioned problems, the relevant manufacturers have tried their best to find a solution, but no suitable design has been developed for a long time, and there is no suitable method and structure for general methods and products to solve the above-mentioned problems. This is obviously a problem that relevant industry players are eager to solve

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