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Spring wire, contact probe, and probe unit

A wire and probe technology, applied to springs, contact parts, low internal friction springs, etc., can solve problems such as high resistivity and achieve the effect of ensuring spring performance

Inactive Publication Date: 2012-03-07
NHK SPRING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As for the material constituting the coil spring, a single material such as copper alloy or precious metal alloy is often used. Alt

Method used

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  • Spring wire, contact probe, and probe unit
  • Spring wire, contact probe, and probe unit
  • Spring wire, contact probe, and probe unit

Examples

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Embodiment Construction

[0028] Hereinafter, embodiments for carrying out the present invention will be described with reference to the drawings. In addition, the drawings are schematic diagrams, and the relationship between the thickness and width of each part, the thickness ratio of each part, etc. may differ from the actual situation in some cases, so please note. Of course, there may be cases where the relationship or ratio of dimensions is different among the drawings.

[0029] figure 1 It is a cross-sectional view showing the structure of the spring wire according to one embodiment of the present invention. Such as figure 1 The wire rod 1 for the spring shown has: the resistivity is 5.00×10 -8 A linear core material 2 made of a conductive material below Ω·m, and a longitudinal elastic modulus of 1.00×10 4 kgf / mm 2 The above spring material constitutes the covering material 3 that covers (covers) the outer periphery of the core material 2 .

[0030] The core material 2 has a circular cross ...

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PUM

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Abstract

Provided is a spring wire that, while achieving electrical conductivity that can even handle high-frequency signals having frequencies of at least 1 GHz, can be used to make springs. Also provided are a contact probe using said spring wire and a probe unit using said contact probe. The spring wire is provided with: a wire core comprising a conductive material with an electrical resistance per unit length of no more than 5.0010-8 Om; and a sheath material (3) that sheathes the wire core and comprises a spring material having a longitudinal elastic modulus of at least 1.00104 kgf/mm and is covered on the peripher of the core material. The thickness d of the sheath material is less than the minimal distance r from the center of gravity of a cross-section of the wire core to the outer edge of said cross-section.

Description

technical field [0001] The present invention relates to a wire for spring, a contact probe formed using the wire for spring, and a probe unit including the contact probe. Background technique [0002] Conventionally, as a contact probe used in the inspection of electrical characteristics of a semiconductor package or the like, a pin-type probe in which two conductive contact portions provided at both ends are connected to each other by a coil spring is known (for example, refer to Patent Document 1 ). As for the material constituting the coil spring, a single material such as a copper alloy or a precious metal alloy is often used. Although these materials have good spring characteristics on the one hand, they have a problem of high electrical resistivity on the other hand. In order to solve this problem and reduce the resistivity of the coil spring, it is known to plate a highly conductive metal such as gold with low resistivity on the surface of the spring material (for ex...

Claims

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Application Information

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IPC IPC(8): G01R1/067C25D7/00F16F1/02G01R1/073G01R31/26H01R13/24
CPCF16F1/021F16F1/024F16F1/04F16F1/042F16F1/047G01R1/045G01R1/0483G01R1/06722H01R13/03H01R13/2421H01R2201/20C25D7/0607G01R31/26H01R13/035
Inventor 风间俊男石川重树
Owner NHK SPRING CO LTD