Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for estimating yield of winter wheat by assimilating characteristics of leaf area index time-sequence curve

A leaf area index and winter wheat technology, applied in the field of agricultural remote sensing, can solve the problems of low spatial resolution of MODIS data, serious mixed pixel effect, and poor assimilation effect.

Active Publication Date: 2015-06-03
CHINA AGRI UNIV
View PDF3 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the main production areas of winter wheat in North China, due to the low spatial resolution of MODIS data, the mixed pixel effect is serious, resulting in systematically low errors in MODIS LAI products, and direct assimilation of MODIS LAI products will lead to worse assimilation effects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for estimating yield of winter wheat by assimilating characteristics of leaf area index time-sequence curve
  • Method for estimating yield of winter wheat by assimilating characteristics of leaf area index time-sequence curve
  • Method for estimating yield of winter wheat by assimilating characteristics of leaf area index time-sequence curve

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0051] In this embodiment, the technical solution of the present invention is further described by taking the estimation of the yield of winter wheat in the southern Hebei research area as an example. The process flow of the winter wheat yield estimation method of the assimilated leaf area index time series curve characteristics of the present embodiment is as follows figure 1 shown, including:

[0052] In step S1, the sensitivity analysis of the crop model in the experimental area is carried out, the remote sensing data and the ground parameters are spatially matched, and the regionalization of the crop model parameters is completed.

[0053] Before analyzing the sensit...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for estimating the yield of winter wheat by assimilating the characteristics of a leaf area index time-sequence curve. The method is implemented through the following steps: S1, performing global sensitivity analysis on a crop model and completing parameter regionalization of the crop model; S2, synthesizing the MODIS LAI (moderate resolution imaging spectroradiometer leaf area index) time-sequence curve; S3, performing filtering processing on the LAI time-sequence curve; S4, performing curve fitting and extracting key characteristic points; S5, operating the crop model in area coverage, performing curve fitting on the LAI time-sequence curve obtained by simulation and extracting the key characteristic points on the curve; and S6, establishing a cost function according to dates of three key characteristic points which are respectively obtained in S4 and S5, taking remote sensing observation error as weight for summating and further getting a total cost function, minimizing the total cost function to rapidly converge the cost function, and finally gathering according to an administrative boundary when convergence conditions are met and outputting a yield result. According to the method disclosed by the invention, the assimilation precision is improved, the affects caused by the situation that an MODIS LAI product system is lower are overcome and the method is further suitable for estimating the yield of the winter wheat at regional scale.

Description

technical field [0001] The invention relates to the technical field of agricultural remote sensing, in particular to a method for estimating winter wheat yield by assimilating the characteristics of the time series curve of leaf area index. Background technique [0002] In the application process of crop yield estimation, crop models based on crop photosynthesis, respiration, transpiration, nutrition and other mechanism processes can accurately simulate the continuous evolution of crop objects in time and space by relying on their inherent physical processes and dynamic mechanisms, and can accurately Simulate the growth and development status and yield of single-point crops. When applied to the regional scale, due to the non-uniformity of the surface and near-surface environments, it is very difficult to obtain some macroscopic data and regionalize parameters in the model. The satellite remote sensing method has the advantages of spatial continuity and temporal dynamic chan...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/04G06Q50/02
Inventor 黄健熙苏伟马鸿元马冠南张超
Owner CHINA AGRI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products