Method for estimating yield of winter wheat by assimilating characteristics of leaf area index time-sequence curve
A leaf area index and winter wheat technology, applied in the field of agricultural remote sensing, can solve the problems of low spatial resolution of MODIS data, serious mixed pixel effect, and poor assimilation effect.
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[0050] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.
[0051] In this embodiment, the technical solution of the present invention is further described by taking the estimation of the yield of winter wheat in the southern Hebei research area as an example. The process flow of the winter wheat yield estimation method of the assimilated leaf area index time series curve characteristics of the present embodiment is as follows figure 1 shown, including:
[0052] In step S1, the sensitivity analysis of the crop model in the experimental area is carried out, the remote sensing data and the ground parameters are spatially matched, and the regionalization of the crop model parameters is completed.
[0053] Before analyzing the sensit...
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