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Method for testing diffused layer resistance of finished cell

A battery sheet and diffusion layer technology, applied in the direction of measuring resistance/reactance/impedance, measuring electrical variables, measuring devices, etc., can solve the problems that the resistance of the diffusion layer cannot be tested, the diffusion cannot be determined, and the sheet resistance cannot be known, etc., to increase The effect of testing costs, ease of operation

Inactive Publication Date: 2013-04-03
ALTUSVIA ENERGY TAICANG
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Problems solved by technology

However, once the film is coated or the cell is finished, the resistance of the diffusion layer cannot be tested.
[0004] At present, in the battery production process, the square resistance sampling ratio is about 2%. Once the efficiency of some batteries is abnormal, the real square resistance cannot be known, and it is impossible to determine whether the problem of diffusion

Method used

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  • Method for testing diffused layer resistance of finished cell
  • Method for testing diffused layer resistance of finished cell
  • Method for testing diffused layer resistance of finished cell

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Embodiment Construction

[0020] The present invention will be further described below in conjunction with the accompanying drawings.

[0021] A method for testing the resistance of the diffusion layer of a finished battery sheet of the present invention is described in detail below in conjunction with preferred specific implementation examples, which mainly includes the following specific steps:

[0022] (1) Take 5 groups of silicon wafers, 5 pieces in each group, clean and texture according to the conventional battery process;

[0023] (2) Put 5 groups of silicon wafers into the tubular diffusion furnace, and carry out phosphorus diffusion according to the target values: 50, 60, 70, 80, 90 ohm / □ respectively;

[0024] (3) Select 5 points evenly on the silicon wafer according to the same pattern, and use a four-probe resistivity tester to test the sheet resistance of the N-type layer after diffusion. The test results are listed in Table 1 below;

[0025] (4) Etch, coat, print electrodes and sinter ac...

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Abstract

The invention discloses a method for testing diffused layer resistance of a finished cell. The method includes: testing square resistance of a plurality of groups of known diffused silicon wafers and square resistance of the finished cell, building mathematical model between the diffused square resistance and the square resistance of the finished cell, and deducing the square resistance of a diffused layer of the finished cell. Compared with the prior art, sheet resistance of the diffused layer of the finished cell can be tested fast and accurately. The method is simple and easy without adding extra testing cost, and easy to operate.

Description

technical field [0001] The invention relates to the photovoltaic industry and the field of performance testing of crystalline silicon batteries, in particular to a method for testing the resistance of a diffusion layer of a finished battery sheet. Background technique [0002] Solar energy is an inexhaustible and inexhaustible source of energy, and is also considered the most potential alternative to traditional fossil energy products. Solar cells are devices that directly convert solar radiation into electrical energy. Because solar cells have no mechanical movement, long service life, and low maintenance costs, they are currently the most ideal photoelectric conversion equipment. Among them, crystalline silicon cells account for more than 90% of the solar energy market due to their high photoelectric conversion efficiency and stable performance. [0003] Conventional crystalline silicon solar cells manufacture P-N junctions by expanding phosphorus on P-type silicon wafers...

Claims

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Application Information

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IPC IPC(8): G01R27/02
Inventor 崔会英谢贤清刘海燕邢国强
Owner ALTUSVIA ENERGY TAICANG
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