Method for automatically testing communication functionality of device under test and computer-readable media thereof

Abstract

An exemplary embodiment of present disclosure illustrates a method for automatically testing communication functionality of a device under test (DUT). The method is adapted for driving and controlling at least an instrument to test communication functionality of a DUT through a computing device. The method includes steps described as follows establishing a communication functionality testing system and providing a user interface installed in the computing device, wherein the user interface includes a DUT selection window providing a plurality of DUT module selections; a testing menu window, providing various preset testing item selections; a selected test list displaying configurable sequence for the selected testing items of a specific testing task; a property table provides property and parameter configurations associated with a selected testing item; and a DUT and instrument configuration window for configuring hardware properties of the DUT and instruments as well as the calibration data of the instruments.

Description

technical field [0001] The present invention relates to a method for automatically testing the communication function of an object under test, and in particular to a method for automatically testing the communication function of an object under test which can configure test programs according to different communication function test requirements. Background technique [0002] With the development of science and technology, communication technology is continuously developed and applied to communication electronic products (such as smart phones, notebook computers and tablet computers, etc.). The communication functions that have been applied to communication electronic products include Bluetooth (Bluetooth), wireless local area network (Wi-Fi), global positioning system (Global Position System, GPS) and radio (FM). [0003] The general communication circuit is designed in an embedded system package chip module (System in Package module, SiP module). In order to ensure the co...

AI Technical Summary

Problems solved by technology

However, it takes extra time to recalibrate the measuring instruments every time the test structure is changed

In summary, the testing process of the communication function of the communication device is time-consuming and labor-intensive, and with the increase of the communication function, the required test items and time will also increase, thereby increasing the manufacturing cost of electronic products and reducing the cost of electronic products. economic benefits and market competitive advantages

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