Memory failure diagnosis device and memory failure diagnosis method

Abstract

An object of the present invention is to provide a memory fault diagnosis that minimizes the fault diagnosis time of the memory in the diagnosis target area by using the interval time after application execution within the preset control period to minimize the time for fault diagnosis of the memory. Device and memory fault diagnosis methods. The area of ​​the memory includes a diagnostic area (41) and a non-diagnostic area (42), the diagnostic area is divided into a plurality of row areas that do not overlap each other, and each row area is divided into a plurality of unit areas that do not overlap each other, the memory The fault diagnosis method is a two-level diagnosis, which includes: an intra-row area diagnosis step for all combinations of unit areas in a group of unit areas in the row area; and a step for all combinations of a group of row areas in the diagnosis area. In the row region diagnosis step of performing diagnosis between row regions, the size of the row region is set such that the diagnosis time within the row region is equal to the diagnosis time between row regions.

Description

technical field [0001] Embodiments of the present invention relate to a memory fault diagnosis device and a memory fault diagnosis method. Background technique [0002] For example, in a safety instrumentation system such as a plant that requires high safety, it is necessary to perform fault diagnosis on the memory of the control device that controls the system. [0003] Since the safety instrumentation system requires long-term continuous operation without restarting in units of years, it is necessary to perform fault diagnosis of the memory not only when the system is started, but also during operation. [0004] Generally speaking, in the failure of the memory that becomes the target of fault diagnosis, in addition to the read / write (Read / Write) error of one memory cell, there is also a problem that when a certain memory cell is read / written, the values ​​of other memory cells are changed. Varying coupling fails. [0005] The fault diagnosis algorithm for the coupling fa...

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Problems solved by technology

[0007] This method can detect the coupling failure of the entire memory area, but because the number of writes and reads (read / write) of the memory is proportional to the square of the memory size, the fault diagnosis time will increase rapidly when the memory capacity of the diagnostic object becomes larger. big problem

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