Reliability prediction method

A reliability and algorithm technology, applied in computing, special data processing applications, instruments, etc., can solve the problems of not considering the radiation sensitivity effect of products, not being able to quantitatively analyze the reliability of components, and not considering the radiation effect, etc.

Active Publication Date: 2014-05-21
BEIJING SHENGTAOPING TEST ENG TECH RES INST
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Problems solved by technology

[0003] 1) It is impossible to quantitatively analyze the impact of environmental stress on the reliability of components;
[0004] 2) The level of user process control and quality control is not considered;
[0005] 3) New failure mechanisms such a

Method used

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Embodiment Construction

[0047] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0048] figure 1 is a flowchart of the algorithm of the present invention, and the present invention provides a reliability prediction algorithm, comprising the following steps:

[0049] S1. Calculate the failure rate λ caused by the single event effect SEE, the total dose effect TID and the displacement damage effect DD of the device respectively SEE , lambda TID and lambda DD ;

[0050] S2, according to the formula λ space =λ TID +λ DD +λ SEE Calculate the failure rate λ due to the space radiation environment space ;

[0051] S3, according to the formula λ=λ NOspace +λ space Calculate the total failure rate λ of the device, where λ NOspace is the failure rate...

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Abstract

The invention discloses a reliability prediction method, comprising the following steps of respectively calculating the failure rate lambda SEE (single event effect), lambda TID (total ionizing effect) and lambda DD (displacement damage) of an SEE, TID and DD; calculating the failure rate lambda space caused by a space radiation environment according to a formula of lambda space=lambdaTID+lambdaDD+lambdaSEE; calculating the total failure rate lambda according to the formula of lambda=lambdaNOspace+lambdaspace, wherein the lambdaNOspace is the failure rate of caused by a non-space radiation environment. According to the reliability prediction method, the radiation stress response is considered, and the reliability prediction method can be used for the reliability prediction of aerospace radiation sensing elements; the prediction result of the method is more accurate compared with that of a constant failure rate-based reliability prediction method.

Description

technical field [0001] The invention relates to the technical field of reliability prediction, in particular to a reliability prediction algorithm. Background technique [0002] The existing reliability prediction methods are mainly based on the assumption of a constant failure rate, such as GJB299 and MIL-HDBK-217, which use the statistical method of the number of failures, and the reliability prediction results of electronic components differ greatly from the actual situation. Has the following defects: [0003] 1) It is impossible to quantitatively analyze the impact of environmental stress on the reliability of components; [0004] 2) The level of user process control and quality control is not considered; [0005] 3) New failure mechanisms such as radiation effects are not considered. [0006] For example, a star uses GJB299 to predict product reliability when demonstrating its power module, but does not consider the radiation sensitive effect of the product, so the ...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 王群勇阳辉陈冬梅白桦陈宇
Owner BEIJING SHENGTAOPING TEST ENG TECH RES INST
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