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Small Field of View Star Matching Method Based on Error Vector Matching

An error vector and matching method technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as matching, observing few stars, difficult to observe stars and star catalogs, etc. Simple, high matching accuracy

Active Publication Date: 2017-02-15
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0005] The technical problem solved by the present invention: Aiming at the problem that the number of stars observed by small-field photoelectric equipment is small at the same time, so that it is difficult to match the observed stars with the star catalog, a star matching method based on error vector matching is provided, which can be used for small-field Stellar Matching for Field Optoelectronic Devices

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  • Small Field of View Star Matching Method Based on Error Vector Matching
  • Small Field of View Star Matching Method Based on Error Vector Matching
  • Small Field of View Star Matching Method Based on Error Vector Matching

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Embodiment Construction

[0028] The following are specific implementation methods of the present invention. But following embodiment only limits to explain the present invention, and protection scope of the present invention should comprise the whole content of claim, and promptly can realize the whole content of claim of the present invention to those skilled in the art through following embodiment.

[0029] The first step of the present invention is to create a list of sub-stars to be matched with the current frame. Its purpose is to preliminarily delineate the stars to be matched, narrow the search range, and reduce the amount of subsequent calculations. Because the stars in the star catalog are recorded at the flat position of the star catalog, and the horizon coordinates of the field of view are known, if the search is performed directly, all the flat positions of the star catalog in the star catalog must be converted to the coordinates of the field of view, resulting in a large amount of calcula...

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Abstract

The invention provides a narrow-view-field star matching method based on error vector matching. By aiming at the problem of matching difficulty between observed stars and a star catalog since a narrow-view-field optoelectronic device observes few stars in the same moment, a principle that the system error of the optoelectronic device is basically unchanged in a certain time and space range is utilized; recent historical frames of the optoelectronic device are combined; and the error vector accumulation effect is utilized for realizing the star matching of the narrow-view-field optoelectronic device. The narrow-view-field star matching method has the beneficial effects that the narrow-view-field star matching method can be applicable to the narrow-view-field optoelectronic device; the matching correctness is high; the requirements on image extraction and the star catalog are low; the parameter setting is simple; and real-time processing can be realized.

Description

technical field [0001] The invention belongs to the field of photoelectric measurement, in particular to a matching method for observing stars and star catalogs in the field of view of photoelectric equipment, in particular to a small field of view star matching method based on error vector matching. Background technique [0002] In a large number of optoelectronic devices, it is necessary to use stars to calibrate or measure the device itself. For example, astronomical telescopes and photoelectric theodolites can calculate their own system errors by measuring the positions of stars, star sensors can navigate by identifying star maps, astronomical positioning systems can calculate the latitude and longitude of stations by photographing stars, and so on. In these applications, there is a common requirement, which is to know which stars in the known star catalog the stars observed in the field of view are, that is, to establish the corresponding relationship between observed s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 罗一涵陈科张涯辉钟代均
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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