Performance testing system and testing method for TOD (Triangle Orientation Discrimination threshold)

A test system and test method technology, which is applied in the direction of TV, electrical components, image communication, etc., can solve the problems of low test accuracy and insufficient density of test samples, and achieve the effect of improving test accuracy, improving test accuracy, and reducing costs

Inactive Publication Date: 2015-01-07
XIDIAN UNIV
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AI Technical Summary

Problems solved by technology

The image bit width used in the traditional test method is 8bit, which has the disadvantages of low test accuracy and insufficient test sample points

Method used

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  • Performance testing system and testing method for TOD (Triangle Orientation Discrimination threshold)
  • Performance testing system and testing method for TOD (Triangle Orientation Discrimination threshold)
  • Performance testing system and testing method for TOD (Triangle Orientation Discrimination threshold)

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Embodiment Construction

[0027] The present invention will be described in detail below in conjunction with the accompanying drawings. The high bit width image in the present invention refers to a 10bit or 12bit image.

[0028] see Figure 1-Figure 4 , the high-bit-wide color depth TOD method performance test system of the present invention includes a main control computer, an image bit width converter and a display; wherein, the main control computer includes an image generation module and a TOD method performance test module, and the image bit width converter includes an FPGA module ;The display is 10bit display or 12bit display;

[0029] Described image generation module is used to complete the parameter setting of test image, the generation of image, the preview of image, the preservation of image, the interaction with external equipment;

[0030] The TOD method performance test module is used to complete the playback of the test image from the image generation module, and pass the test image to...

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Abstract

The invention discloses a performance testing system and a testing method for a TOD (Triangle Orientation Discrimination threshold). The performance testing system comprises a main control computer, an image bit width converter and a display, wherein the main control computer comprises an image generating module and a TOD performance testing module; the image generating module is used for finishing parameter setting of a test image, generation of the image and preview of the image; the TOD performance testing module is used for finishing playing of the test image from the image generating module, recording a judgment result on the target direction of the test image, and transmitting the test image to the image bit width converter; and the image bit width converter is used for realizing bit width conversion of the test image. According to the performance testing system and the testing method, the bit width of the test image is increased from 8 bits to 10 bits or 12 bits by adopting the image bit width converter, and the minimum contrast is decreased from 1/256 to 1/1024, so that cost is reduced; and the color depth of the image is tested easily and conveniently by adopting the TOD, so that the minimum contract of the test image is decreased, and the testing correctness and the testing accuracy of the TOD are increased.

Description

technical field [0001] The invention relates to performance evaluation of a photoelectric imaging system, in particular to a TOD method performance test system and a test method. Background technique [0002] Triangle Orientation Discrimination threshold (TOD) method is a new method that can fully characterize the performance of photoelectric imaging system and is easy to use. This method uses equilateral triangles of different sizes and different contrasts as test splines , through the photoelectric imaging system, the observer repeatedly judges the triangle orientation, and obtains the relationship curve between the threshold contrast and the triangle size corresponding to the 75% correct judgment probability. It is considered as a new method applicable to the performance characterization of new optoelectronic imaging systems in the future. The image bit width used in the traditional test method is 8bit, which has the disadvantages of low test accuracy and insufficient de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
Inventor 何国经张冬阳白鑫鹏刘鑫谢世雄栗旭光
Owner XIDIAN UNIV
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