51results about How to "Increase bit width" patented technology

In a solid state imaging device to be included in an imaging device such as a digital camera, a ramp run-up AD conversion circuit for AD converting a pixel signal is provided corresponding to one or a plurality of pixel columns. A column counter provided in each ramp run-up AD conversion circuit holds an upper bit, and a clock signal is supplied to one or plural latches for holding a lower bit. Thus, fast and accurate AD conversion can be realized while suppressing increase of clock frequency.

A solid-state imaging device includes: a column comparison circuit which compares a pixel signal with ramp waves and detects a timing at which the pixel signal and the ramp waves match; a counter circuit which is disposed for each of the pixel columns and measures the timing in the column comparison circuit by being supplied with a clock signal; and M first inverters which are equidistantly connected in series, wherein the counter circuit belongs to one of M groups corresponding to each of the M first inverters disposed in the upper clock stage, the odd-numbered group has second inverters disposed between the output terminal of the first inverter corresponding to the group and the counter circuit of the group, and the even-numbered group has buffers disposed between the output terminal of the first inverter corresponding to the group and the counter circuit of the group.

The invention relates to an interleaver or deinterleaver method and a device thereof based on a block interleaver, an interleaver or deinterleaver block is extended to a square, when a first time interleaver or deinterleaver is carried out by the method of writing by row and reading by column, then a second time interleaver or deinterleaver is carried out by the method of writing by column and reading by row, therefore, the second time writing and the first time reading are basically carried out at the same time in a same memory and the data which is not processed by the first time interleaver or deinterleaver is not washed off. The method is carried out all the time alternately, only an extended memory is needed to finish the interleaver/deinterleaver, thereby greatly reducing the size of the needed memory, meanwhile, a little buffer memory is added before the memory to increase the bit wide of the memory, thereby being convenient to process.

A method for forming a semiconductor device is disclosed. A method for forming a semiconductor device includes forming a first bit line contact over a semiconductor substrate, forming a second bit line contact that is coupled to the first bit line contact and has a larger width than the first bit line contact, and forming a bit line over the second bit line contact. When using the semiconductor device having a buried gate, although the bit line is formed to have a small width and the bit line pattern is misaligned, the method prevents incorrect coupling between a bit line and a bit line contact, so that it basically deteriorates unique characteristics of the semiconductor device.

The present invention relates to an error control technology in the communication system and discloses a method and an apparatus for implementing Cyclic Redundancy Check (CRC) codes to improve the operation performance of the system significantly and satisfy operation requirements when processing high-rate CRC data. The method includes: performing at least one XOR operation for information bits input in parallel to obtain a first result, where at least one pipeline is added during the XOR operation; performing an XOR operation for a previously obtained CRC code to obtain a second result; and performing an XOR operation for the second result and the first result to obtain a current CRC code. The present invention is applicable to any field that needs to implement CRC codes by means of hardware.

The present invention provides an uplink and downlink wave beam shaping measure system and method. The uplink and downlink wave beam shaping measure system and method are able to measure and obtain the transmission matrix of a whole wave beam shaping system based on a software radio technology. The system comprises: a sending terminal of an uplink wave beam shaping system, wherein a sending channel is connected with a calibration channel of a sending channel amplitude consistency calibration network and the receiving channel of the feed source matrix of the uplink wave beam shaping network; the sending channel amplitude consistency calibration network employing an online calibration mode; and a downlink wave beam shaping system receiving terminal, wherein the receive channel is connected with the sending channel of the feed source matrix of the downlink wave beam shaping network. The uplink and downlink wave beam shaping measure system and method are able to ensure the accurate degree of the sending terminal to send multi-path sinusoidal signal amplitude phase information and perform the calibration of sending feed source signals and the test of the receiving feed source signals at the same time so as to improve the test efficiency of the test system and effectively reduce the test workload and the test system complexity.

A digital filter comprises a plurality of filter units each realizing mutually independent filter functions with a predetermined recursive filter order on a signal path between the input and the output of the filter and operating at a first clock rate, a plurality of sampling devices operating at the first clock rate, and a weighting network coupled to the sampling devices and operating at a second clock rate. The filter units comprise at least one delay element which can be reset to a predeterminable value. To each of the filter units one of the sampling devices is allocated setting the respective delay element to a predetermined value dependent on a sampling rate conversion factor. An input signal is conducted, via the weighting network, to a respective sampling device, or digital internal sampling signals output by a respective sampling device are conducted to the output via the weighting network.

The invention provides a resistive memory with better area efficiency without degrading reliability, which includes an array area, word lines, a local bit line, source lines, and a shared bit line. In the array area, memory cells are arranged in a matrix, and each memory cells includes a variable resistance element and an accessing transistor. The word lines extend in a row direction of the array area and are connected to the memory cells in the row direction. The local bit line extends in a column direction of the array area. The source lines extend in the column direction and are connected to first electrodes of the memory cells in the column direction. The shared bit line is connected to the local bit line. The shared bit line extends in the row direction and is connected to second electrodes of the memory cells in the row direction.

The embodiment of the invention discloses a data writing method, a data reading method and a first-in first-out memory, and the data writing method comprises the steps: determining a target number of to-be-started writing interfaces according to a working mode of the first-in first-out memory; splitting to-be-written original data into a target number of sub-data according to the reference bit width; and writing the target number of sub-data into the first-in first-out memory through the target number of write-in interfaces. The data reading method comprises the steps of determining a target number of to-be-started reading interfaces according to a working mode of a first-in first-out memory; reading the target number of to-be-read sub-data from the first-in first-out memory through the target number of read-out interfaces; and splicing the target number of sub-data into original data. According to the invention, one first-in first-out memory is utilized to meet the requirements of different application scenes, the number of first-in first-out memories in a chip is reduced, resources are saved, the area of the chip is reduced, and meanwhile, expansion of various bit widths and depths can be carried out.

A method for fabricating a semiconductor device is provided. The method includes sequentially forming etch target layers, a hard mask layer and an anti-reflective coating layer, selectively etching the anti-reflective coating layer and the hard mask layer using a gas generating polymers, thereby increasing a line width of a bottom portion of the hard mask layer due to the polymers, and etching the etch target layers using a patterned hard mask layer with the increased line width.

Disclosed are a digital control oscillator and a magnetic resonance imaging system. The digital control oscillator comprises a phase accumulation unit, a quantitative shaping unit and a conversion unit. The phase accumulation unit is used for accumulating frequency control words to generate first phase signals; the quantitative shaping unit is used for quantizing the first phase signals to generate second phase signals, performing low-frequency attenuation and high-frequency amplification on quantizing noises generated from quantization and performing low-pass filtering on the quantizing noises subjected to low-frequency attenuation and high-frequency amplification; the conversion unit is used for outputting waveform data corresponding to the second phase signals. Since the quantizing noises are shaped by the digital control oscillator, the signal to noise ratio and the stray-free dynamic range of outputted periodic signals are increased.

The invention discloses a video compression system and method, a computer readable storage medium and a server, the video compression system comprises a color space conversion module, a memory, an FIFO array module, a read-write control module and a video compression control module, the memory comprises a cache space and a compressed data storage space, the FIFO array module comprises a plurality of FIFOs, and the read-write control module comprises a read-write control module and a video compression control module. The FIFO is used for storing data of a Y component or a V component or a U component, and the FIFO array module is configured to correspondingly set the bit width of the FIFO based on the number of the FIFO so as to enable the FIFO to store the data of the Y component or the U component or the V component of two adjacent rows at the same time; and the read-write control module is configured to sequentially read Y component or U component or V component data at corresponding positions of two adjacent rows from the corresponding FIFO in each clock period and send the data to the video compression control module. Through the scheme of the invention, the reading speed of the video data and the video compression speed are improved.

The invention discloses a controllable Chiplet serial test circuit, and belongs to the technical field of testing or measuring of semiconductor devices in the manufacturing or processing process. The test circuit comprises a master control test module, a slave control test module, a clock control module and an output module, the master control test module is composed of a test access port module, a segment insertion bit module and a test data register module, and a test control signal is generated through the master control test module; the slave control test modules respectively control test input signals of the slave control core particles after receiving the test control signals. Meanwhile, the test control signal is input to the clock control module to obtain a clock signal of the slave control core particle. The output signal of the test output module is determined by the test control signal. According to the test circuit, an external test port is used for directly controlling an internal test signal of the multi-core-particle integrated circuit, core particle test selection and final test output are realized, and effectiveness and independence of each core particle test are ensured.

The invention relates to the communication technical field, in particular to an ARM-based data acquisition network uploading device with high efficiency and low cost. The device is characterized by comprising an FPGA (Field Programmable Gate Array) module used for carrying out data acquisition and processing, an ARM module used for receiving data output by the FPGA module and packaging and uploading according to a UDP (User Datagram Protocol), a PHY (Physical Layer) module used for receiving the data uploaded by the ARM module and an RJ45 interface module connected to the PHY module. The FPGA module adopts ALTERA Cyclone V series, the ARM module adopts ATMEL SAMA5 series, the PHY module adopts Micrel ksz9031 series, and the RJ45 interface can upload the data to an upper computer or a router. In comparison with the prior art, gigabit Ethernet is realized based on the ARM, and meanwhile, the device and the method have the advantages of low cost, safety, reliability and the like and are suitable for data acquisition and uploading application of mass data in multiple fields.

The invention provides an image processing method, apparatus and device, and a storage medium. The image processing method comprises the steps of obtaining an acquired first image in a first data format and an acquired second image in the first data format; wherein the first image and the second image both comprise target objects, the positions of the target objects in the first image and the second image are the same, the first image is a visible light image, and the second image is a near-infrared light image; processing the first image and the second image to obtain a third image and targetposition information of the target object, wherein the third image fuses color information of the first image and gray information of the second image; and intercepting an area corresponding to the target position information from the second image to obtain a first area image in a first data format, and performing enhancement processing on the first area image to obtain a fourth image for targetobject identification. Complete monitoring information can be provided, and the accuracy of target recognition is improved.

The invention discloses a radiation-resistant reinforcing method for an on-satellite reconfigurable FIR filter. The method comprises the steps of firstly acquiring the bit width of the filter, and performing reinforcement or not according to conditions, wherein when the bit width is expanded, occupied BRAM is increased and the idle BRAM cannot be provided, reinforcement is not performed, and when the bit width is expanded and the occupied BRAM is unchanged, or when the bit width is expanded and the residual idle BRAM is provided, radiation-resistant reinforcement is performed on the parameter of the reconfigurable filter on the ground; and then acquiring the number of on-satellite idle multiplying units, the number of on-satellite idle Slice resources, and the number of the multiplying units and the number of Slice resources used by the filter, if the number of the on-satellite idle multiplying units is not less than the sum of 1 and the number of the used multiplying units, and the number of the idle Slice resource is more than or equal to the product of the number of the used Slice resources and (1+1/n), using the filter to achieve radiation-resistant fault detection and correction of a circuit, and if no idle multiplying unit is provided or the number of the idle Slice resources is less than the quotient of the number of Slice resources and n, using the filter with low resource consumption to achieve radiation-resistant fault detection of the circuit, and otherwise using the filter with the single multiplying unit to achieve radiation-resistant fault detection of the circuit.

The invention relates to a cell analyzer capable of synchronously storing paths of pulse data and a control method of the cell analyzer. The cell analyzer comprises a light source generation module, light signal receiver modules, signal processing modules, ADC collection modules, an FPGA module and a DDR storage module. The number of the light signal receiver modules, the number of the signal processing modules and the number of the ADC collection modules are the same; and the light signal receiver modules, signal processing modules, ADC collection modules, FPGA module and DDR storage module are electrically connected in order. According to the provided cell analyzer, the FPGA module replaces a microcontroller, a parallel processing manner of the FPGA and abundant logic resources of the same are used, data synchronization units correspond to the paths of digital pulse data, the speed is improved by increasing the area, and thus, the paths of digital pulse data are synchronously stored.

The invention discloses a fractional-type frequency dividing ratio phase-locked loop, and the phase-locked loop comprises a voltage-controlled oscillator which provides a plurality of oscillation clock signals of different phases; a fractional frequency divider which comprises a multi-analog-to-digital frequency divider which is connected with the voltage-controlled oscillator so as to receive the first oscillation clock signal and provide a first frequency-divided clock signal; a phase rotator which is used for sampling the first frequency division clock signal based on the plurality of oscillation clock signals to obtain a plurality of sampling signals; and a phase interpolator which receives two sampling signals with adjacent phases as a first threshold signal and a second threshold signal, wherein linear interpolation is carried out between the first threshold signal and the second threshold signal to obtain a second frequency division clock signal, and the working frequency of the phase interpolator is lower than that of the voltage-controlled oscillator. According to the fractional frequency divider, frequency division is carried out on the first frequency division clock signal provided by the multimode frequency divider based on the phase rotator and the phase interpolator, the fractional frequency divider with higher resolution and higher linearity can be obtained, and quantization noise of a loop is reduced.