Apparatus for rapid measurement of grain size and magnetic domain wall width of grain-oriented silicon steel sheets

Abstract

The invention discloses a device for rapidly measuring grain size and magnetic domain wall width of oriented silicon steel sheet, which comprises a sample stage and a displaying part; the displaying part includes a display window and a contact layer, and the display window is transparent A glass plate or a transparent hard plastic plate, a liquid storage cavity for filling the visible suspension is formed between the display window and the contact layer; The suspension injection hole, and the closed air hole of the liquid storage chamber used to balance the pressure in the liquid storage chamber, the suspension injection hole and the closed air hole of the liquid storage chamber can be opened or closed as required; the sample table is provided with a magnetic The yoke is provided with a magnetizing winding, and when the magnetizing winding is energized, the oriented silicon steel sample placed on the sample stage can be magnetized. The device adopts the principle of powder grain method, which can quickly and accurately measure the grain size and magnetic domain wall width of grain-oriented silicon steel sheets.

Description

technical field [0001] The invention relates to an analysis and detection device for an oriented silicon steel sheet, in particular to a device for rapidly measuring the grain size and the width of a magnetic domain wall of an oriented silicon steel sheet. Background technique [0002] Silicon steel is a very important functional metal material, especially grain-oriented silicon steel, which has always been known for its complicated preparation process and high technical requirements. The loss of grain-oriented silicon steel is one of the core performance evaluation bases. [0003] Long-term studies have found that the loss of grain-oriented silicon steel is closely related to its grain size and magnetic domain wall width. If the grain size is too small, the grain boundaries will increase relatively, and the hysteresis loss will increase significantly during the repeated magnetization process. However, if the grain size is too large, the domain wall motion speed will increa...

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Problems solved by technology

[0006] The above-mentioned device mainly has the following disadvantages: ①The sample size is limited, and only smaller samples can be observed, while the grain changes of grain-oriented silicon steel are relatively complicated, and it is difficult for small-sized samples to represent the actual situation of large-sized samples; ② The observation suspension is in direct contact with the sample, and it cannot be reused after use, which is wasteful, and it takes time and effort to repeatedly configure the suspension; ③ Due to the intermediate magnetic field formed by the double-sided winding, the magnetic field at the center is more complicated

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