Device and method of testing ratio chromatism of optical system of star sensor

A technology of optical system and magnification chromatic aberration, applied in the field of optical detection, can solve problems such as hindering the process of commercialization of star sensors

Inactive Publication Date: 2016-02-24
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] The existence of these limitations makes the star sensor optical system test process a bottleneck in the entire development process, hindering the pr...

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  • Device and method of testing ratio chromatism of optical system of star sensor
  • Device and method of testing ratio chromatism of optical system of star sensor
  • Device and method of testing ratio chromatism of optical system of star sensor

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Embodiment Construction

[0069] see figure 1 , the star sensor optical system magnification chromatic aberration testing equipment provided by the present invention, this equipment comprises: target simulation part, measured optical system installation part, microscopic acquisition part, control and data processing computer 12; Target simulation part, measured optical system The installation part and the microscopic collection part are sequentially arranged on the test optical axis; the control and data processing computers are respectively connected with the target simulation part, the tested optical system installation part and the microscopic collection part.

[0070] The target simulation components include a monochromator 4, a filter target wheel 3, a target target wheel 2 and a collimator 1; the light outlet of the monochromator 4 faces the focal plane of the collimator 1; the filter target wheel 3 is located in the monochromator Between 4 and the target target wheel 2; the target surface of the...

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Abstract

The present invention provides a device and method of testing a ratio chromatism of an optical system of a star sensor. The device provided by the invention comprises an object simulation part, a tested optical system installation part, a microscope acquisition part and a control and data processing computer. The object simulation part, the tested optical system installation part and the microscope acquisition part are arranged in turn on the same light path; the object simulation part includes a monochromator, a collimator, an optical filter target wheel and an object target wheel; the optical filter target wheel and the object target wheel are arranged in turn on the emergent light path of the monochromator; the target surface of the object target wheel is overlapped with the focal plane of the collimator; an optical system to be tested is arranged on the tested optical system installation part; and the control and data processing computer is connected with the monochromator, the optical filter target wheel having optical filters with various spectrum ranges, the object target wheel with multi-group target boards and the tested optical system installation part. The device and method of testing a ratio chromatism of an optical system of a star sensor have high testing efficiency, few testing personnel and expandable testing ranges.

Description

technical field [0001] The invention belongs to the field of optical detection, and relates to an automatic test device and a test method for key parameters of an optical system of a star sensor, in particular to a test device and a test method for automatically measuring the chromatic aberration of magnification of the optical system of a star sensor. Background technique [0002] The star sensor is a high-precision space attitude measurement device with the star as the reference system, the starry sky as the working object, and the satellite, spacecraft, aircraft, ship and missile as the carrier. When working, it detects the positions of different stars on the celestial sphere, Compare it with known star maps to provide accurate spatial orientation and benchmarks for the carrier. [0003] The star sensor optical system is an important part of the star sensor, and its parameters (such as spectral energy concentration and chromatic aberration of magnification, etc.) directly...

Claims

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Application Information

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IPC IPC(8): G01M11/02G01C25/00
Inventor 张洁薛勋赵建科周艳胡丹丹徐亮刘峰陈永权赵怀学张欢焦璐璐段炯郑党龙
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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