Ellipsoidal reflector-based total internal reflection fluorescence microscopic imaging device
An ellipsoidal reflector and microscopic imaging technology, which is applied in the direction of microscopes, optics, optical components, etc., can solve the problems that the incident angle cannot be adjusted, and the incident angle adjustment range is small, so as to reduce the invalid lighting energy and reduce the shading effect , The effect of small loss of light energy
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[0015] The specific implementation of the device of the present invention will be further described below.
[0016] The total internal reflection fluorescence microscopic imaging device based on the ellipsoidal reflector of this embodiment, the structural schematic diagram is as follows figure 1 shown. The total internal reflection fluorescence microscopic imaging device based on an ellipsoid reflector is sequentially provided with a laser 1, a collimator beam expander 2, a shielding sheet 3, an illumination objective lens 4, an ellipsoid reflector 5, a hemispherical lens 6, and a glass along the direction of light propagation. Stage 7, imaging objective lens 8, filter plate 9, tube lens 10 and CCD11; The focal point of described focusing lens 4 coincides with the second focus position of ellipsoidal reflector 5, and the first focus of ellipsoidal reflector 5 is located in the glass Table 7 upper surface; the axis of rotation of the hemispherical lens 6 coincides with the opt...
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