Test method for test quality of high and low temperature low pressure test chamber
A high-low-temperature, low-pressure, and inspection method technology, which is applied to measuring devices, measuring electrical variables, instruments, etc., can solve problems such as the inability to ensure accurate, reliable and effective detection results of high-low temperature, low-pressure tests, and achieve accurate detection results
Active Publication Date: 2020-03-27
GOERTEK INC
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Problems solved by technology
At present, there is no corresponding inspection method for high-low temperature and low-pressure tests, and it is impossible to ensure the accuracy, reliability and effectiveness of high-low temperature and low-pressure test results.
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[0020] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0021] Select the same high and low temperature and low pressure test chamber and use the same test method to ensure that the temperature in the high and low temperature and low pressure test chamber should be within the specified test standard atmospheric condition temperature range of 15°C to 35°C. Test as follows:
[0022] Step 1: Under the condition of no load in the high and low temperature and low pressure test chamber, select the altitude H from the severity level of the air pressure test in GB / T 2423.21-2008;
[0023]
[0024] Step 2: Set the corresponding altitude H of the high-low tem...
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The invention belongs to the high-and-low-temperature low-pressure test technology field and especially relates to an examination method of high-and-low-temperature low-pressure test chamber test quality. The method comprises the following steps of selecting an altitude height H under a high-and-low-temperature low-pressure test-chamber no-load condition; setting the high-and-low-temperature low-pressure test chamber to correspond to the altitude height H and making the high-and-low-temperature low-pressure test chamber start to work; making an altitude height of an internal environment of the high-and-low-temperature low-pressure test chamber be stable and keeping for a certain period, and in the certain period, reading a corresponding pressure value from a pressure gauge of the high-and-low-temperature low-pressure test chamber at set intervals; measuring another group of pressure values by another examination person; and calculating a pressure deviation, an F examination value F (f1, f2), and according to calculation results, carrying out verification determination. By using the examination method of the high-and-low-temperature low-pressure test chamber test quality, the high-and-low-temperature low-pressure test chamber test quality can be examined and a high-and-low-temperature low-pressure test detection result can be guaranteed to be accurate, reliable and effective.
Description
technical field [0001] The invention belongs to the technical field of high-low temperature and low-pressure tests, and in particular relates to a test method for test quality of a high-low temperature and low-pressure test chamber. Background technique [0002] High-low temperature and low-pressure test chambers are mainly used in aviation, aerospace, electronics, national defense, scientific research and other industrial sectors to determine whether electrical and electronic technology products (including components, materials and instruments) are under the single or simultaneous action of high, low and low pressure. The test piece is tested for storage and transportation reliability, and the test piece can be energized to test the electrical performance parameters. At present, there is no corresponding inspection method for high-low temperature and low-pressure tests, and it is impossible to ensure the accuracy, reliability and effectiveness of high-low temperature and lo...
Claims
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IPC IPC(8): G01R35/00G01N7/00
CPCG01N7/00G01R35/00
Inventor 林俊龙
Owner GOERTEK INC