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Correction method for near-field effect of triplet target array

A near-field effect, triplet technology, applied in the field of correction, can solve the problem of deviation between the ideal position of the radiation center and the actual position, and achieve the effect of improving the target control accuracy

Active Publication Date: 2021-01-22
SHANGHAI INST OF ELECTROMECHANICAL ENG
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Problems solved by technology

[0004] In view of the defects in the prior art, the purpose of the present invention is to provide a method for correcting the near-field effect of triplet target arrays, which can solve the problem of deviation between the ideal position of the radiation center and the actual position caused by the triplet near-field effect

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  • Correction method for near-field effect of triplet target array
  • Correction method for near-field effect of triplet target array
  • Correction method for near-field effect of triplet target array

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Embodiment Construction

[0018]The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be pointed out that for those of ordinary skill in the art, a number of modifications and improvements can be made without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0019]Such asFigure 1 to Figure 3As shown, the near-field effect correction method of the triple target array of the present invention includes the following steps:

[0020]Step 1: Calibrate the accuracy of the array triplet, and measure the position accuracy in the horizontal and vertical directions respectively. Due to the near-field effect distribution characteristics of the triplet, the measurement points are selected as followsfigure 1 The middle rectangular area is measured, and...

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Abstract

The invention provides a near-field effect correction method for a three-element group target array. The method comprises: step one, calibrating the precision of an array three-element group and measuring horizontal and vertical position accuracy respectively; step two, according to measurement results from the step one, acquiring weight values of horizontal and vertical correction functions; stepthree, according to weighted values, acquiring a horizontal correction function and a vertical correction function; step four, according to the location of the target at the array, finding out a corresponding three-element group and calculating a precise normalized location of a target point in the three-element group; step five, carrying out calculation at the precise position in the three-element group to obtain a new normalized coordinate position of the target in the three-element group; and step six, acquiring energy values of three horn antennas of the three-element group. Therefore, aproblem of an offset between an ideal position and an actual position of a radiation center due to the near-field effect of the three-element group is solved.

Description

Technical field[0001]The invention relates to a correction method, in particular, to a correction method of the near field effect of a triple target array.Background technique[0002]The hardware-in-the-loop simulation system is a system that simulates the target signal in the laboratory and analyzes and verifies the guidance and control system. The hardware-in-the-loop simulation system plays an indispensable role in reducing research and development costs, shortening the development cycle, and providing development levels.[0003]The hardware-in-the-loop simulation test system is a large and complex system, and the important part of the triple array system is used to simulate the electromagnetic environment and radiate target signals. The antenna array is mainly composed of adjacent antenna triads, and each triad is composed of horn antennas at the three vertices of an equilateral triangle. The radar signal reflected by the target is simulated by the radio frequency radiation of the a...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B17/02
CPCG05B17/02
Inventor 王立权柳超杰郝恩义袁晴晴朱伟华刘晓娟张宇
Owner SHANGHAI INST OF ELECTROMECHANICAL ENG