Probe polarization rotation device, electromagnetic field sampling system and electromagnetic field sampling method

Abstract

The invention provides a probe polarization rotation device, which finishes measurement of horizontal and vertical components of an electromagnetic field through single-polarization probes, and comprises a power unit for providing rotation power; the single-polarization probes, the number of which is at least two, and the initial polarization setting directions of which are same; and drive units for acting the power provided by the power unit onto the single-polarization probes to enable the single-polarization probes to finish polarization synchronous rotation. By changing a conventional single dual-polarization probe into a plurality of single-polarization probes, sampling measurement of one component can be carried out simultaneously at multiple sampling points; through cooperative action of the added power unit and the drive units, all of the single-polarization probes are driven to rotate for 90 degrees simultaneously, and sampling measurement of another component is finished; andmeasurement of two components is finished at one sampling point in one polarization, so that measurement results of two components on the same point have no error, and sampling precision is improved.

Description

Background technique [0001] Near-field measurement is carried out with network analysis and receiving probes. In traditional near-field measurement systems, the filling to be measured is usually kept fixed, and the probe is rotated around it to obtain different plane, cylinder, and spherical field diagrams. In the spherical field, the electromagnetic wave is often represented by two mutually perpendicular polarization components E _theta, E _phi; in the plane field, it is often represented by E _x, E _y; in the cylindrical field, it is often represented by E _z, E _phi. [0002] Because two components in the electromagnetic field need to be measured, in order to describe the target electromagnetic field, the electric field probe is often used to receive the electromagnetic wave in space, sample relevant data and send it to the computer for analysis and result display. The most conventional method is to use a single dual-polarization probe to detect and sample the electromagnet...

AI Technical Summary

Problems solved by technology

The most conventional method is to use a single dual-polarization probe to detect and sample the electromagnetic field. The working principle can refer to the electromagnetic field near-field scanning device and scanning method disclosed in the Chinese invention patent with the publication number CN103941106A. The problems with this measurement method are , if the electromagnetic field is relatively large and there are many points to be collected, the entire collection speed will be very slow

[0003] In addition, the polarization probe is composed of copper-copper sulfate reference electrode and the surrounding carbon steel plate and salt bridge. In the same polarization of the polarization probe, the composition of different parts will have certain deviations. , if the electric field probe is a dual-polarization probe, the difference in composition between the two polarizations will be even greater, that is, there are differences in performance and parameters between the two polarizations of the dual-polarization probe, which leads to the use of a dual-polarization probe There is a large difference in sampling the two polarizations, making the measurement results not very accurate

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