Measuring method of backscattering nanoparticle particle size measuring device for high-concentration samples
A backscattering and nanoparticle technology, applied in measurement devices, particle size analysis, particle and sedimentation analysis, etc., can solve the problem of inability to obtain particle size distribution information, and achieve the reduction of multiple light scattering effects, multiple scattered light intensity, The effect of reducing the scattered light path
Active Publication Date: 2020-08-21
遵义汇通院士科技有限公司 +1
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Problems solved by technology
Since diffusion spectroscopy requires that the received scattered light is only multiple scattered light, it is only suitable for particle samples with very high concentrations and no single scattering
In addition, since the diffusion spectrum method uses photons to fully diffuse in the particle system to obtain particle size information, it can only measure the average particle size of the particle system, but cannot obtain particle size distribution information
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[0029] Figure 1~3 It is the best embodiment of the present invention, below in conjunction with attached Figure 1~3 The present invention will be further described.
[0030] Such as figure 1 As shown, the backscattering nanoparticle particle size measurement device for high-concentration samples includes a sample cell 1 with a test sample built in, a lens 2 is arranged behind the sample cell 1, and an attenuation sheet 3 and a laser are arranged in sequence behind the lens 2 4. The light emitted by the laser 4 passes through the attenuation sheet 3 and the lens 2 and then enters the sample cell 1 .
[0031] GRIN lens 6 is arranged at the rear of lens 2 simultaneously, and GRIN lens 6 is positioned at the side of laser 4, and the light output end of GRIN lens 6 is connected with optical fiber, and optical fiber is connected to the input end of photomultiplier tube 10, and the output of photomultiplier tube 10 The photon correlator 11 is connected to the photon correlator 1...
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The invention provides a backscattering nano-particle granularity measuring device and measuring method for a high-concentration sample, belonging to the technical field of particle granularity detecting. The backscattering nano-particle granularity measuring device and measuring method for the high-concentration sample is characterized in that: a lens (2), a laser device (4), and a GRIN lens (6)are sequentially arranged on the rear side of a sample cell (1); the output end of the GRIN lens (6) is connected to the input end of a photomultiplier (10); and the output end of the photomultiplier(10) is connected to the input of a photon correlator (11); and the backscattering nano-particle granularity measuring device for the high-concentration sample is also provided with a lens adjustmentdevice used for adjusting the separation distance between the GRIN lens (6) and the sample cell (1), and the GRIN lens (6) is placed in the lens adjustment device. Through the backscattering nano-particle granularity measuring device and measuring method for the high-concentration sample, the incident light and the scattered light are located on the back side of the sample cell; therefore, the scattered light does not need to completely pass through a test sample in the sample cell; thus, the scattering optical path is reduced, the multiple light scattering effect is reduced, and the granularity measurement of the high-concentration test sample is realized.
Description
technical field [0001] The invention relates to a measurement method of a backscattering nanometer particle size measuring device for high-concentration samples, and belongs to the technical field of particle size detection. Background technique [0002] The particle size and distribution of nanoparticles are important parameters to characterize their performance, and dynamic light scattering technology is an effective method for particle size measurement of nanoparticles. In the state-of-the-art dynamic light scattering particle measurement technology, photon correlation spectroscopy is a commonly used method. Photon correlation spectroscopy obtains particle size information by measuring the fluctuation of scattered light at a fixed spatial position. Since the theoretical model of photon correlation spectroscopy is based on the single scattering of incident light, and for samples with higher concentration, due to the small distance between particles, the scattered light co...
Claims
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IPC IPC(8): G01N15/02
CPCG01N15/0205
Inventor 刘伟秦福元王雅静申晋马立修陈文钢
Owner 遵义汇通院士科技有限公司