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Observing method for one-dimensional nano material

A nanomaterial and carbon nanotube technology, which is applied in the field of observing one-dimensional nanomaterials with an optical microscope, can solve the problems of inability to image, the limitation of the morphological structure and arrangement direction of the measured nanomaterials, and the degradation of image quality.

Active Publication Date: 2019-03-05
TSINGHUA UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the method and device have certain limitations on the morphology, structure and arrangement direction of the measured nanomaterials.
For example, if the measured carbon nanotubes are bent or bent, the quality of the image obtained by using the method and device will be significantly reduced or even impossible to image.

Method used

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Embodiment Construction

[0041] The method for observing one-dimensional nanomaterials provided by the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0042] The invention provides an observation method for one-dimensional nanomaterials, which is used for distinguishing one-dimensional nanomaterials with different chirality. The one-dimensional nanomaterial refers to a hollow or solid material whose radial dimension is in the range of 1 nm to 100 nm, whose longitudinal dimension is much larger than the radial dimension, and whose aspect ratio can reach tens to tens of thousands, such as: nanotubes, Nanorods, nanowires, nanofibers, nanoribbons, etc. Common one-dimensional nanomaterials include carbon nanotubes, graphene narrow bands, metal nanowires, carbon fibers, etc. In the embodiment of the present invention, only carbon nanotubes are taken as an example for illustration, and it can be understood that the method ...

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Abstract

The invention relates to an observing method for carbon nanotubes. The observing method for the carbon nanotubes comprises the following steps: providing a to-be-observed one-dimensional nano material; soaking the to-be-observed one-dimensional nano material in coupling liquid; providing first incident light and second incident light to simultaneously illuminate the to-be-observed one-dimensionalnano material, wherein the to-be-observed one-dimensional nano material is in resonance rayleigh scattering under illumination of the first incident light and the second incident light, the first incident light and the second incident light have continuous spectra, and incidence directions of the first incident light and the second incident light are not parallel; and observing the to-be-observedone-dimensional nano material which is in resonance rayleigh scattering by using an optical microscope. By the observing method, the one-dimensional nano material which is in an optional morphologicalstructure and an optional arrangement direction can be observed, and the position, and the position, form and chiral information of the one-dimensional nano material are acquired.

Description

technical field [0001] The invention relates to a method for observing one-dimensional nanomaterials, in particular to a method for observing one-dimensional nanomaterials with an optical microscope. Background technique [0002] One-dimensional nanomaterials prepared by existing methods, such as carbon nanotubes, are usually mixed together with different chiralities, different diameters, and different lengths. Intermixed carbon nanotubes can be quantitatively distinguished by their own chirality. Carbon nanotubes with different chiralities exhibit different colors when resonant Rayleigh scattering occurs. Wu Wenyun et al. provided a method and device for observing the chirality of nanomaterials, using the resonant Rayleigh scattering image of carbon nanotubes to judge whether the chirality of multiple carbon nanotubes is consistent, and can further calculate the chirality of each carbon nanotube. sex index. However, the method and device have certain limitations on the m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/49
CPCG01N21/49G01N15/00G01N2015/0038G01N21/658G02B21/0016G02B21/10G01N15/1484G02B21/361G01N2015/1497G01N21/51G01N21/255
Inventor 武文赟李东琦张金姜开利范守善
Owner TSINGHUA UNIV
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