Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A fast counting method of wheat basic seedlings based on machine vision and graphics processing

A graphics processing and machine vision technology, applied in the field of agricultural planting information collection and processing, can solve problems such as poor reliability, low counting efficiency, and high labor intensity, and achieve the effects of convenient sampling, reduced labor intensity, and time saving

Active Publication Date: 2019-03-08
HENAN AGRICULTURAL UNIVERSITY
View PDF12 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The technical problem to be solved by the present invention is to provide a fast counting method for basic wheat seedlings based on machine vision and graphic processing, to solve the problem that the existing counting of basic wheat seedlings requires manual counting, low counting efficiency, high labor intensity, and poor reliability. technical problem

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A fast counting method of wheat basic seedlings based on machine vision and graphics processing
  • A fast counting method of wheat basic seedlings based on machine vision and graphics processing
  • A fast counting method of wheat basic seedlings based on machine vision and graphics processing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] Embodiment one: the basic seedling fast counting method of wheat based on machine vision and graphic processing comprises the following steps,

[0058] (1) Acquisition of basic seedling images

[0059] The image collection time of the basic wheat seedlings should be at the 1st-3rd leaf stage of the wheat seedling stage. After the 3rd leaf stage of the wheat seedling stage, the leaves of the wheat seedlings on the picture overlap more seriously, which will affect the recognition accuracy. In this embodiment, four test fields are respectively selected, and these four test fields are respectively planted with Yumai 49, Xinong 509, Zhoumai 27, and Aikang 58, these four common wheat varieties in Henan area, and during the period of 1-3 leaves of wheat Perform image acquisition.

[0060] In order to enable the method of the present invention to be applied to agricultural production practice at low cost, the resolution of the camera of the image acquisition device is not less...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A fast counting method of wheat basic seedlings based on machine vision and graphics processing is proposed to solve the technical problem of low counting efficiency of wheat basic seedlings, and includes the following steps of acquiring basic seedling images, enhancing image restoration and performing target count. In the target count, the image processed by the step S8 is counted by using the connected area comparison method to obtain the number of wheat basic seedlings, so that the blocking adhesion of the wheat seedlings can be read and recognized, and the number of wheat basic seedlings is equal to the number of wheat seedlings counted in each connected area. By using machine vision and graphics processing method, the counting efficiency is high, and the method is suitable for large-scale statistics of wheat planting or germination.

Description

technical field [0001] The invention belongs to the technical field of agricultural planting information collection and processing, and in particular relates to a fast counting method for basic wheat seedlings based on machine vision and graphic processing. Background technique [0002] Wheat is one of the important food crops in my country, and wheat production is directly related to national food security and social stability. In wheat production, the investigation and counting of basic seedling conditions of wheat are the most basic agronomic traits to ensure high and stable yield of wheat, and it is also one of the important parameters for predicting wheat yield. The determination of the basic seedling number of traditional wheat mostly adopts the survey method, that is, at the wheat seedling stage, the number of seedlings in a certain area is obtained by manual counting, and converted into basic seedlings per mu. The following two methods are commonly used: [0003] Th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06T7/136G06T7/194G06T7/62
CPCG06T7/0002G06T2207/10024G06T2207/30188G06T2207/30242G06T7/11G06T7/136G06T7/194G06T7/62
Inventor 许鑫乔红波熊淑萍张娟娟冯洋洋
Owner HENAN AGRICULTURAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com