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Design method of TDICMOS imaging unit

A technology of imaging unit and design method, which is applied in the direction of electrical components, pulse generation, electric pulse generation, etc., can solve the problems of complex design and poor stability of TDICMOS imaging unit, and achieve the effect of avoiding difficulty in acquisition, avoiding reflection, and convenient acquisition

Inactive Publication Date: 2019-07-19
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] The invention provides a design method of a TDICMOS imaging unit in order to solve the problems of complex design and poor stability of the existing TDICMOS imaging unit

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  • Design method of TDICMOS imaging unit
  • Design method of TDICMOS imaging unit
  • Design method of TDICMOS imaging unit

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specific Embodiment approach 1

[0021] Specific implementation mode 1. Combination Figure 1 to Figure 5 In this embodiment, the design method of the TDICMOS imaging unit includes two parts: a controller unit and a detection unit. The detector unit includes a TDICMOS detector, an operational amplifier, an LDO, a driver with a Schmitt function, and a level shifter with a Schmitt function. The controller unit generates the control signals required by the detector unit and receives the digital image data output by the detector unit. The operational amplifier and LDO generate the operating voltage required by the detector, the driver with Schmitt function generates the driving signal required by the TDICMOS detector, and the level shifter with Schmitt function generates the control signal required by the TDICMOS detector .

[0022] In this embodiment, two methods are used for the power supply of the pixel part with sinking current. The first method is the existing method, which is generated by the method of "r...

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Abstract

The invention discloses a design method of a TDICMOS imaging unit, relates to a design method of a TDICMOS imaging unit, solves the problems that the existing TDICMOS imaging unit is complex in designand poor in stability. A controller unit and a detector unit are included, the controller unit generates a control signal required by the detector unit and receives the digital image data output by the detector unit; the detector unit comprises a TDICMOS detector, an operational amplifier, an LDO, a driver with a Schmidt function and a level shifter with a Schmidt function. According to the invention, power supply of a pixel part with pull-fill current, transmission of a digital input control signal, a generation mode of a charge transfer driving signal, a placement mode of a via hole in a high-density region and processing of a multilayer grounding plane are designed respectively; the utilization area of the circuit board is increased to the maximum extent, the integrity of control driving signals and a power supply is improved, and meanwhile voltage breakdown, pseudo soldering and other risks are avoided.

Description

technical field [0001] The invention relates to a design method of a TDICMOS imaging unit, in particular to a design method of a highly reliable TDICMOS imaging unit in a size-limited environment. Background technique [0002] For the charge domain TDICMOS imaging design, the detector not only includes the photosensitive part of the TDICCD detector and the gate of the charge transfer, but also includes the related double sampling and digital-to-analog conversion circuit, timing generator, bias, SPI register and LVDS There are many functional parts, such as receivers and transmitters. Due to the many functional parts of the TDICMOS detector, the TDICMOS imaging design is complex, and careful design inspection is required to ensure stable and reliable operation. Contents of the invention [0003] The invention provides a design method of the TDICMOS imaging unit in order to solve the problems of complex design and poor stability of the existing TDICMOS imaging unit. [000...

Claims

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Application Information

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IPC IPC(8): H03K3/0233H01L27/146
CPCH01L27/146H03K3/02337
Inventor 余达刘金国徐东苗健宇杨亮胡庆龙王玉龙
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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