Identification method of insulator pollution components based on micro-hyperspectral technology
An identification method and insulator technology, applied in the direction of optical testing flaws/defects, image enhancement, instruments, etc., can solve the problems of cumbersome operation process and inability to observe the distribution of contamination components on the surface of insulators, so as to achieve simple operation process and eliminate the unevenness of light source , Improve the effect of reliability and safety
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[0041] Such as figure 1 As shown, the embodiment of the present invention discloses a method for identifying pollution components of insulators based on microscopic hyperspectral technology, including the following steps:
[0042] S1: Select the sampling area, disassemble part of the insulators and bring them back and record their picking positions, windward side, leeward side and other information one by one, cut the insulating sheet to get the dirty sample of the polluted insulator, and obtain the microscopic hyperspectral image, according to the statistical law (Statistical law is an expression of the classification training set and test set, such as trying to make the data balance when dividing, not excessive tilt, etc.) Divided into the first atlas set and the second atlas set;
[0043] Correction processing, choose the black and white correction method, the formula is:
[0044]
[0045] In the formula, R ci Image data corrected for black and white; Sample ciis the ...
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