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Test fixture for quickly plugging and unplugging plurality of memories

A test fixture and memory technology, which is applied in error detection/correction, faulty computer hardware, instrument detection, etc., can solve the problems of inability to guarantee the reliability and stability of memory sticks, low work efficiency, etc., and achieve burn-in testing Effect

Inactive Publication Date: 2020-02-04
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of the above existing problems, the present invention provides a test fixture for quickly plugging and unplugging multiple memory sticks to solve the problems of manually pressing the memory sticks during testing, low work efficiency and failure to guarantee the reliability and stability of the memory sticks

Method used

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  • Test fixture for quickly plugging and unplugging plurality of memories
  • Test fixture for quickly plugging and unplugging plurality of memories
  • Test fixture for quickly plugging and unplugging plurality of memories

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Embodiment Construction

[0026] In order to clearly illustrate the technical features of the solution, the solution will be described below through specific implementation modes.

[0027] as attached figure 1 As shown: the present invention is a test fixture for quickly plugging and unplugging multiple memories. A connecting rod transmission mechanism 3 is provided, and a bracket 4 is provided at both ends of the base 1 near the handle 2, and a sliding block 5 is slid on the bracket 4, and the opening and closing of the breaking handle 2 drives the sliding block 5 up and down, and the base 1 is provided with a card slot 6, and the card slot 6 is set between the brackets 4 and is set along the length direction of the base 1.

[0028] Such as image 3 As shown: the handle 2 includes a first connecting part 21, a second connecting part 22 and a third connecting part 23, the first connecting part 21 is arc-shaped, and one end of the first connecting part 21 is provided with a hinged part 211, and the ot...

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Abstract

The invention provides a test fixture for quickly plugging and unplugging multiple memories, and belongs to the technical field of memory test. The technical scheme is as follows: the test fixturemethod comprises the following steps: preparing raw materials; including a base, wherein the base comprises two end parts and a middle part; the two end parts are hinged with breaking handles; a connecting rod transmission mechanism is arranged between the breaking handles, brackets are arranged at the positions, close to the breaking handles, of the two ends of the base, sliding blocks are arranged on the brackets in a sliding mode, the breaking handles are opened and closed to drive the sliding blocks to ascend and descend, clamping grooves are formed in the base, and the clamping grooves are formed between the brackets and formed in the length direction of the base. The universal jig fixture has the beneficial effects that the universal jig is based on memory testing, the jig which isfixture is designed to be simple, rapid and pluggable is designed, the jig fixture is matched with testing software, the memory can be simply, rapidly and massively tested, whether the memory works normallyor not is checked, the aging test of the memory can be achieved, and high-quality memory can be screened in advance.

Description

technical field [0001] The invention relates to the technical field of memory testing, in particular to a test fixture for quickly plugging and unplugging multiple memories. Background technique [0002] Memory is a key component of server products, and its quality performance is crucial. A large amount of memory has been repaired and replaced on both the client side and the production line side. At present, the overall reliability test of the memory still needs to rely on large-scale equipment, and a server platform needs to be built. Each memory needs to be pressed into the memory stick one by one. It is impossible to quickly and massively test the memory to ensure the reliability and stability of the product and meet the requirements of fast and effective. production. Contents of the invention [0003] In view of the above existing problems, the present invention provides a test fixture for quickly plugging and unplugging multiple memory sticks to solve the problems of...

Claims

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Application Information

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IPC IPC(8): G06F11/00G06F11/22G06F11/26
CPCG06F11/008G06F11/2205G06F11/26
Inventor 弭先亮赵鸿宪
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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