37results about How to "Implement burn-in testing" patented technology

The invention belongs to the field of laser display and discloses a laser device aging testing cabinet at least comprising a main controller, a laser device power source module, a laser power detection module, a water chiller, a temperature-control air conditioner, a case and a laser device chamber which are integrated to be of an integrated cabinet-type structure through related electric-control lines and related conveying pipelines. The laser device aging testing cabinet is compact in structure and convenient to operate; the power source module is arranged through computer software to provide current driving for laser devices, dozens of laser devices are tested simultaneously in real time, monitored voltage, temperature and power of the laser devices are output to a display interface of the main controller to realize aging testing of tricolor laser devices, and reliability and stability of laser display products are guaranteed.

The invention discloses a visual sensor working state test method, which comprises the following steps that a visual sensor to be tested is fixed on a test device, and a closed darkroom is formed in an inner cavity of the test device; a target is arranged in a camera view field range of the visual sensor; according to the preset test flow, the camera is used for acquiring an image of the target when the component I is in an open/closed state; and the gray comparison analysis or template matching is carried out on the acquired image and a standard image acquired in a corresponding state of eachmoment of a preset test flow; according to the test method, the dependence of the test process on personnel is reduced, the judgment error caused by subjective judgment is eliminated, and the reliability of the test result is improved.

The invention discloses an aging testing system for liquid crystal display modules. The aging testing system comprises a downloader, a main control board and multiple sub-control boards connected with the main control board, and the main control board is connected with the downloader. The downloader is used for receiving testing information of the liquid crystal display modules of multiple types of machines to be tested. The main control board is used for providing the testing information of the liquid crystal display modules of the machines to be tested for the corresponding sub-control boards connected with the liquid crystal display modules of the machines to be tested. Each sub-control board is used for generating a testing image signal, the received testing information of the liquid crystal display modules of the machines to be tested and the testing image signals are provided for the corresponding liquid crystal display modules after first signal conversion is performed so that the corresponding liquid crystal display modules can display corresponding testing images according to the signals obtained after first signal conversion is performed, and then aging testing is achieved for the liquid crystal display modules. The aging testing system can be adapted for testing liquid crystal display modules of different types of machines, and can improve testing efficiency.

The invention provides an aging test method and system for a high-speed switch chip, characterized by placing an IC under test in an aging board in a dynamic aging test; providing an excitation signalfor the aging board through a control board; performing high temperature and voltage pull tests on the IC under test; performing a digital pin pull-down operation on a digital part of the IC under test; performing a loopback test on an simulation part of the IC under test; and performing transmission and reception tests on a switch module of the IC under test. According to the aging test method and system for the high-speed switch chip, the aging test of the digital part, the simulation part, and the switch part of the high speed switch chip can be realized, and the aging screening test itemsfor early failure products are covered more comprehensively, thereby facilitating to discover more potential problems during the aging test. In addition, the aging resistance of each functional module can be found in time by monitoring and displaying the results of various functional test items of high-temperature dynamic aging in real time, and the test results are analyzed by storing aging information in real time.

The invention discloses a flow production line of a fresh air ventilator. The flow production line of the fresh air ventilator comprises a horizontal overturning conveying line, a vertical overturningconveying line, an ageing line and a finished product conveying line which are connected end to end. The horizontal overturning conveying line is formed by connecting multiple horizontal overturningtables and powerless roller lines. The vertical overturning conveying line is formed by connecting multiple vertical overturning tables and powerless roller lines. Each powerless roller line is composed of a rectangular outer frame and rollers arranged in the outer frame in parallel. A power roller line is composed of a rectangular outer frame, a drive motor arranged at the bottom of the rectangular outer frame, a chain wheel and a transmission chain, wherein the chain wheel and the transmission chain are driven by the drive motor. The flow production line is high in automation degree, the product assembling qualification rate can be obviously increased, homocentric square shape arrangement is adopted, parts are conveyed out, become qualified products and are then sent back, manual work and storage space can be effectively saved, the requirement for manual work is lowered, and the production cost is greatly reduced.

The invention provides an aging furnace and an aging method. The aging furnace comprises a heat insulation chamber, a heater, a temperature control device and at least one furnace body, wherein the furnace body is communicated with the heat insulation chamber, the heater is used for heating the heat insulation chamber so that the temperature of the heat insulation chamber is the test temperature, the temperature control device is used for measuring the temperature of the heat insulation chamber and controls the work of the heater according to the measuring results so that the temperature of the heat insulation chamber is the test temperature, the furnace body is used for carrying out aging treatment on a liquid crystal display panel, and the heat insulation chamber is used for carrying out aging test on the liquid crystal display panel in the aging treatment process at the test temperature, so the aging furnace realizes the aging test on the liquid crystal display panel in the aging treatment process through the heat insulation chamber.

The invention discloses an aging testing system for liquid crystal display modules. The aging testing system comprises an MCU, a distributor, a crystal oscillator connected with the distributor and multiple auxiliary control panels. The MCU is used for conducting first signal conversion on testing information of the liquid crystal display modules of multiple types to be tested; the crystal oscillator is used for providing clock signals; the distributor is used for generating enable signals, generating reset signals according to the enable signals and providing the generated enable signals, the reset signals and the clock signals provided by the crystal oscillator and the testing information provided by the MCU for the corresponding control panels connected with the liquid crystal display modules of the multiple types to be tested; each control panel is used for turning on the corresponding liquid crystal display module when receiving the testing information, provided by the distributor, of the liquid crystal display module of the corresponding type to be tested, the enable signals, the reset signals and the clock signals to realize aging testing on the corresponding liquid crystal display module. The aging testing system can be suitable for testing the liquid crystal display modules of different types and can improve testing efficiency.

The invention provides a transporting mechanism for aged vehicles, and belongs to the technical field of tests. By the aid of the transporting mechanism, the problem of excessively high consumption of manpower resources required by aging tests on chargers in the prior art can be solved. The transporting mechanism for the aged vehicles comprises a framework, a worktable, a first driving roller, a first driven roller and a first transmission belt. A first servo motor is horizontally fixed onto the worktable, an aging line is fixed to the transmission belt, conductive carbon brushes are fixed onto the aging line, a tool plate is further arranged on the conducting carbon brushes, and the aged vehicles can be mounted on the tool plate; a control system capable of controlling the rotational speeds of the first servo motor is further arranged on the framework. The transporting mechanism has the advantages that the aged vehicles can be efficiently powered on in conveying procedures, and accordingly aging tests can be carried out on chargers.

The invention relates to a position sensor aging test system and method for magnetic levitation equipment, and the system comprises a constant temperature box, a resistance tester, a controller, and alarm equipment. The constant temperature box is used for placing a to-be-tested position sensor; the constant temperature box is provided with a test port and a test line penetrating through the testport, and the to-be-tested position sensor is connected with the first end of the test line; the resistance tester is connected with the second end of the test line; the controller is respectively connected with the constant temperature box, the resistance tester and the alarm equipment; and the controller receives the resistance test data transmitted by the resistance tester within the heating time, processes the resistance test data, and triggers the alarm device to give an alarm when the resistance test data exceeds a resistance threshold range. The aging test of the position sensor is realized, the unqualified position sensor is checked, the fault of the magnetic suspension equipment caused by the direct installation of the unqualified position sensor on the magnetic suspension equipment is prevented, and the use stability of the position sensor is improved.

The invention relates to an OLED (Organic Light Emitting Diode) driving circuit, a display panel, a preparation method and display equipment, in the circuit, the anode of an organic light emitting diode is connected with a driving node, and the cathode of the organic light emitting diode is connected with a low power supply voltage end; the cathode of the diode device is connected with the anode of the organic light-emitting diode; the output end of the auxiliary cathode circuit is connected with the anode of the diode device, and the auxiliary cathode circuit receives a test current signal; a connecting part is arranged between the low power supply voltage end and the auxiliary cathode line; in the aging test period, the connecting part is disconnected, so that the auxiliary cathode line transmits a test current signal to the organic light emitting diode; and after the aging test period is finished, the connecting part is conducted, so that the organic light-emitting diode works normally. In the aging test process, the flowing large current can avoid the TFT path, the negative influence of the large current on the TFT device is eliminated, and after the aging test is completed, the normal light emitting of the organic light emitting diode is not influenced, and the reliability of the OLED driving circuit is improved.

The invention provides an aging circuit board, an aging test structure and an aging test method, the aging circuit board is provided with a first surface and a second surface, and the first surface and the second surface are oppositely arranged; the first surface is provided with a first connection area, the first connection area is provided with a first connection pad, and the first connection pad is used for connecting a first chip; the second surface is provided with a second connection area, the second connection area is provided with a second connection pad, and the second connection pad is used for connecting a second chip; and the aging circuit board is internally provided with a signal connection structure, and the first connection pad and the second connection pad are in signal connection through the signal connection structure. According to the invention, the signal connection between the first connection pad and the second connection pad is realized through the signal connection structure in the aging circuit board, and the first connection pad and the second connection pad are respectively used for connecting the first chip and the second chip, thereby facilitating the verification of the interconnection function between the first chip and the second chip.

The present invention relates to a LED aging test device. The LED aging test device comprises a carrier, a first wiring seat, a second wiring seat, a first clamping piece and a second clamping piece.A groove is configured to adapt a package substrate shape of a sample to be tested of a first type of a LED, the height of a first flange extruded out of the bottom wall is smaller than the height ofthe side wall of the groove relative to the bottom wall of the groove, and the first flange is matched with the bottom wall of the groove to form a first groove body. The first groove body is configured to adapt the package substrate shape of a sample to be tested of a second type of LED. The first clamping piece is configured to clamp one of polar plates of the samples to be tested of the LEDs, and the second clamping piece is configured to clamp the other one of the polar plates of the samples to be tests of the LEDs. The LED aging test device can achieve aging test of the samples to be tested of the two types of the LEDs so as to reduce the test cost.

The invention provides an aging vehicle conveying line and belongs to the technical field of testing. The aging vehicle conveying line solves the problem that more manpower resources need to be consumed when an aging test is carried out on a charger in the prior art. The aging vehicle conveying line comprises a rack and a workbench. The workbench is provided with a conveying mechanism. The conveying mechanism comprises a first driving rolling wheel, a first driven rolling wheel and a first conveying belt, wherein an aging line is fixed to the first conveying belt, conductive carbon brushes are fixed to the aging line, and tooling plates are arranged on the conductive carbon brushes. The workbench is provided with a swing mechanism. The swing mechanism comprises a second driving wheel, a second driven wheel and a second conveying belt. A first transfer mechanism is arranged at the feed end of the first conveying belt and the discharge end of the second conveying belt. A second transfer mechanism is arranged at the discharge end of the first conveying belt and the feed end of the second conveying belt. A control system is arranged on the rack. The aging vehicle conveying line has the advantages that an aging vehicle can be more efficiently tested by being powered on and cyclic operation can be conducted in the conveying process.

The invention provides a laser chip aging test system and method. The system comprises an aging test module which is provided with a plurality of chips to be tested, an optical fiber transmission module comprising a plurality of optical fibers, a light receiving test module and a control and processing module; each optical fiber corresponds to one to-be-tested chip, the first end of each optical fiber is arranged at the light emitting position of the corresponding to-be-tested chip so as to collect the laser emitted by the to-be-tested chip, and the second end of each optical fiber outputs the laser; the light receiving test module is used for collecting and testing the laser output by the optical fiber transmission module; and the control and processing module is connected with the aging test module and the light receiving test module, and is used for analyzing the measurement data output by the light receiving test module to obtain the aging test data of the chip to be tested, and controlling the light receiving test module to collect the laser output by each optical fiber in the optical fiber transmission module according to the aging test data. Therefore, decoupling of the aging test and the optical test in space can be realized, and the system design is effectively simplified.