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Online aging test device

A technology of aging test and test voltage, applied in the field of computer, can solve the problem of not being able to aging test and so on

Active Publication Date: 2021-09-07
上汽英飞凌汽车功率半导体(上海)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the purpose of this application is to provide an online aging test device to improve the problem that the existing HTRB test cannot perform aging tests on mass-produced products in real time

Method used

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Embodiment approach

[0035] In order to test multiple products to be tested at the same time, the number of relay groups can be further increased. For example, in an optional implementation, the number of relay groups is 3, one relay group corresponds to one IGBT module, and 3 relay groups are connected in parallel , so that the online aging test device can simultaneously perform aging tests on the half-bridge circuit composed of three parallel IGBT modules. Correspondingly, the number of measurement circuits is also three, and one IGBT module corresponds to one measurement circuit. In this implementation manner, the number of the first terminal connected to the collector C, the second terminal connected to the gate G, and the third terminal connected to the emitter E are all three. The first relay and the second relay in each relay group are connected in the same manner, and reference may be made to the foregoing description. The three relay groups correspond to the same power supply component, t...

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Abstract

The invention relates to an online aging test device, and belongs to the technical field of computers. The device comprises a power supply assembly relay set and a control host. The power supply assembly comprises a power supply and a measuring circuit. The relay set comprises a first relay and a second relay, the first end of the first relay is connected with the positive electrode of the power supply, and the second end of the first relay is connected with a first terminal used for being connected with the collector electrode of the IGBT module. The first end of the second relay is connected with a second terminal used for being connected with the grid electrode of the IGBT module, the second end of the second relay is connected with a third terminal used for being connected with the emitting electrode of the IGBT module, and the second end of the second relay is further connected with the negative electrode of the power supply. The control host controls the connection or disconnection of the first relay and the second relay, and is also used for determining whether the IGBT module is qualified or not according to the leakage current measured by the measuring circuit. By increasing the test voltage, the device can carry out 100% on-line test on mass production products.

Description

technical field [0001] The application belongs to the technical field of computers, and in particular relates to an online aging test device. Background technique [0002] Currently, the reliability test of an insulated gate bipolar transistor (Insulated Gate Bipolar Transistor, IGBT) power module is performed on a sample before mass production. Among them, the aging test is an important item in the reliability test. Technical means of the aging test include a high temperature reverse bias test (High Temperature Reverse Bias Test, HTRB) and the like. [0003] Among them, the HTRB test is a sample laboratory test, which is an aging test of up to 1,000 hours for the product in a high-temperature environment (usually 150 degrees Celsius for automotive power modules), simulating the lifetime of the power module. Use the environment. During the test, the gate G and the emitter E are short-circuited, and the voltage VCE (usually 90% of the rated blocking voltage) is increased b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2642
Inventor 张怡廷
Owner 上汽英飞凌汽车功率半导体(上海)有限公司
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