Laser chip aging test system and method

A chip aging test and aging test technology, applied in lasers, laser parts, semiconductor lasers, etc., can solve the problems of difficult system design and high spatial position matching requirements, and achieve convenient system design, simplification of system design, and reduction of system cost effect

Pending Publication Date: 2022-02-22
武汉锐晶激光芯片技术有限公司
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Problems solved by technology

[0003] In the current conventional aging test scheme, the optical test equipment must be integrated with the aging main system in a single cabinet or a fixed area, and the requirements for the matching of the two spatial positions are relatively high, and the system design is difficult

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  • Laser chip aging test system and method
  • Laser chip aging test system and method
  • Laser chip aging test system and method

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Embodiment Construction

[0023] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0024] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art wi...

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Abstract

The invention provides a laser chip aging test system and method. The system comprises an aging test module which is provided with a plurality of chips to be tested, an optical fiber transmission module comprising a plurality of optical fibers, a light receiving test module and a control and processing module; each optical fiber corresponds to one to-be-tested chip, the first end of each optical fiber is arranged at the light emitting position of the corresponding to-be-tested chip so as to collect the laser emitted by the to-be-tested chip, and the second end of each optical fiber outputs the laser; the light receiving test module is used for collecting and testing the laser output by the optical fiber transmission module; and the control and processing module is connected with the aging test module and the light receiving test module, and is used for analyzing the measurement data output by the light receiving test module to obtain the aging test data of the chip to be tested, and controlling the light receiving test module to collect the laser output by each optical fiber in the optical fiber transmission module according to the aging test data. Therefore, decoupling of the aging test and the optical test in space can be realized, and the system design is effectively simplified.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a laser chip aging testing system and method. Background technique [0002] Long-term stability and service life are one of the key performances of high-power semiconductor laser chips. The aging test method is usually used in the industry to test and judge, that is, to continuously inject current into the packaged semiconductor laser chip through special testing equipment to make it Continue to work, and evaluate the relevant performance of chip products by monitoring, testing, and analyzing parameters such as the output power and wavelength of the chip during the work process. [0003] In the current conventional aging test scheme, the optical test equipment must be integrated with the aging main system in a single cabinet or a fixed area, and the requirements for matching the spatial positions of the two are relatively high, making the system design difficult. Contents ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01S5/00
CPCH01S5/0021
Inventor 安海岩王威徐豪
Owner 武汉锐晶激光芯片技术有限公司
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