led aging test device

A technology for burn-in testing and packaging substrates, which can be used in diode testing, single semiconductor device testing, etc., and can solve problems such as increased testing costs and waste of resources.

Active Publication Date: 2020-11-24
佛山市顺德区蚬华多媒体制品有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

A traditional type of LED packaging product generally has a corresponding fixture or test device for product life evaluation. However, with the rapid development of the LED industry, LED product types are constantly being introduced, and LED packaging forms are evolving. The more diversified, it is necessary to change its aging test device frequently, resulting in increased test cost and waste of resources

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Embodiment Construction

[0029] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0030] In the description of the present invention, it should be understood that the terms "first" and "second" are used for description purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly indicating the quantity of indicated technical featu...

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Abstract

The present invention relates to a LED aging test device. The LED aging test device comprises a carrier, a first wiring seat, a second wiring seat, a first clamping piece and a second clamping piece.A groove is configured to adapt a package substrate shape of a sample to be tested of a first type of a LED, the height of a first flange extruded out of the bottom wall is smaller than the height ofthe side wall of the groove relative to the bottom wall of the groove, and the first flange is matched with the bottom wall of the groove to form a first groove body. The first groove body is configured to adapt the package substrate shape of a sample to be tested of a second type of LED. The first clamping piece is configured to clamp one of polar plates of the samples to be tested of the LEDs, and the second clamping piece is configured to clamp the other one of the polar plates of the samples to be tests of the LEDs. The LED aging test device can achieve aging test of the samples to be tested of the two types of the LEDs so as to reduce the test cost.

Description

technical field [0001] The invention relates to the technical field of LED aging testing, in particular to an LED aging testing device. Background technique [0002] LED (Light Emitting Diode, referred to as LED) has been widely used due to its advantages of high reliability, long life, and environmental protection. In the manufacturing process of LED products, its performance is mainly evaluated and tested through aging tests with different currents and environmental tests under different temperature and humidity conditions. A traditional type of LED packaging product generally has a corresponding fixture or test device for product life evaluation. However, with the rapid development of the LED industry, LED product types are constantly being introduced, and LED packaging forms are evolving. The more diversified, it is necessary to change its aging test device frequently, resulting in increased test cost and waste of resources. Contents of the invention [0003] Based o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2635
Inventor 邓自然王书方
Owner 佛山市顺德区蚬华多媒体制品有限公司
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