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Aging test fixture

A kind of aging test and fixture technology, applied in the direction of single semiconductor device testing, measuring electricity, measuring device, etc., can solve the problems of uneven force of laser diode, pulse current, inconvenient adjustment, etc., so as to improve the efficiency of aging test and avoid pulse current. , the effect of uniform force

Pending Publication Date: 2021-01-19
KEY & CORE TECH INNOVATION INST OF THE GREATER BAY AREA
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Problems solved by technology

[0002] After the laser diode is manufactured, in order to ensure that the laser diode can work normally for a long time, it is necessary to perform an aging test inspection. The existing test fixture usually uses the power-on method of pressing down the probe to supply power to the positive and negative poles of the laser diode to be tested. The pressing force applied by the needle on the laser diode is not easy to adjust, and it is easy to cause uneven force on the laser diode to generate pulse current, and it is easy to cause the problem of overheating of the laser diode

Method used

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Embodiment Construction

[0027] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0028] It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present.

[0029] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as...

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Abstract

The invention relates to an aging test fixture. The aging test fixture comprises a base, a first electrode assembly, a second electrode assembly and an elastic piece, wherein the first electrode assembly is arranged on the base and is used for positioning and bearing a laser diode to be tested; the second electrode assembly can move in the direction close to or away from the first electrode assembly, and the second electrode assembly presses and holds the laser diode; the pressing and holding assembly is separably abutted against the second electrode assembly, and the pressing and holding assembly can drive the second electrode assembly to move towards the direction close to the first electrode assembly, so that the second electrode assembly presses the laser diode on the first electrode assembly and enables the laser diode to form an aging test loop; the elastic piece elastically abuts against the position between the second electrode assembly and the base, is used for providing elastic force for the second electrode assembly to move in the direction away from the first electrode assembly, and is further used for adjusting the pressing force of the second electrode assembly on thelaser diode through elastic deformation of the elastic piece.

Description

technical field [0001] The invention relates to the technical field of semiconductor lasers, in particular to an aging test fixture. Background technique [0002] After the laser diode is manufactured, in order to ensure that the laser diode can work normally for a long time, it is necessary to perform an aging test inspection. The existing test fixture usually uses the power-on method of pressing down the probe to supply power to the positive and negative poles of the laser diode to be tested. The pressing force exerted by the needle on the laser diode is inconvenient to adjust, and it is easy to cause uneven force on the laser diode to generate pulse current, and it is easy to cause the problem of overheating of the laser diode. Contents of the invention [0003] Based on this, the present invention provides an aging test fixture capable of improving the stress uniformity of the laser diode to be tested during the aging test. [0004] An aging test fixture, comprising: ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R1/04
CPCG01R31/2601G01R1/0425
Inventor 秦占阳王亚磊高森代华斌
Owner KEY & CORE TECH INNOVATION INST OF THE GREATER BAY AREA
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