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Probe Fixing Components

A technology for fixing components and probes, which is applied to the parts, instruments, measuring devices and other directions of electrical measuring instruments, and can solve problems such as the requirements for the smoothness of the contact surface, the limitation of the length and angle of the probe bracket, and the inability to meet the test requirements of the test point.

Active Publication Date: 2022-04-29
MINGSHUO COMP (SUZHOU) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the traditional probe fixing device, the length and angle of the probe bracket are limited, which cannot meet the testing requirements of all test points
In addition, although some traditional probe fixing devices have suction cups in the clamping part, the bottom of the suction cups has high requirements for the contact surface, there must be enough space for the suction cups, and there are requirements for the smoothness of the contact surface

Method used

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  • Probe Fixing Components
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Examples

Experimental program
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Embodiment Construction

[0062] A number of implementations of the present disclosure will be disclosed below with the accompanying drawings. For the sake of clarity, many practical details will be described together in the following description. However, it should be understood that these practical details should not be used to limit the present disclosure. That is to say, in some embodiments of the present disclosure, the practical details are unnecessary. In addition, for the sake of simplifying the drawings, some known and conventional structures and elements will be shown in a simple and schematic manner in the drawings.

[0063] figure 1 It is a side view of a probe fixing assembly 100 according to an embodiment of the present disclosure. As shown in the figure, the probe fixing assembly 100 includes a support rod 110 , a telescoping rod 120 and a spring chuck 130 . The telescopic rod 120 is pivotally connected to the supporting rod 110 . The collet 130 is located at the end of the telescopi...

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PUM

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Abstract

A probe rod fixing component is used for fixing a probe rod. The probe mounting assembly consists of a support rod, a telescoping rod, and a collet. The telescopic rod is pivotally connected to the supporting rod. The collet is located at the end of the telescopic rod away from the support rod, and is used to clamp the probe. The spring collet includes a housing, at least one button and a plurality of elastic clips. The casing has an inner wall surface and an outer wall surface opposite to each other, and the inner wall surface surrounds the accommodating space. The button protrudes from the outer wall of the housing. The elastic clamp protrudes from the inner wall of the housing to the accommodation space, and is connected to the button. When the button is pressed, the elastic clamp shrinks synchronously toward the inner wall and stores elastic potential energy, so that the probe can be accommodated in the accommodation. In the space, when the button is released, the elastic clamping parts move away from the inner wall under the action of the elastic potential energy, so as to clamp the probe. When the button is pressed, the elastic clamping part is pulled to move toward the outer wall of the housing, causing the spring in the elastic clamping part to compress, so as to put the probe into the accommodating space.

Description

【Technical field】 [0001] The present disclosure relates to a probe fixing assembly, in particular to a probe fixing assembly capable of elastically adjusting the position of the probe. 【Background technique】 [0002] Oscilloscopes and probes are often used in the process of measuring various signals on the motherboard. In order to place the probe perpendicular to the main board and avoid loops, it is necessary to fix the signal line and the gold needle probe manually or with a probe fixing device. However, in the traditional probe fixing device, the length and angle of the probe bracket are limited, which cannot meet the test requirements of all test points. In addition, although some traditional probe fixing devices have suction cups in the clamping part, the bottom of the suction cups has high requirements for the contact surface, there must be enough space for the suction cups, and there are requirements for the smoothness of the contact surface. 【Content of invention】...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067
CPCG01R1/067G01R1/06722
Inventor 冯莹陈安泰
Owner MINGSHUO COMP (SUZHOU) CO LTD