A method and device for automatic calibration of infrared thermal imager based on tec

An infrared thermal imager, automatic calibration technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., to achieve the effect of ensuring compensation accuracy, ensuring processing accuracy, and simple temperature control process
CN111562013BActive Publication Date: 2021-03-23北京富吉瑞光电科技股份有限公司

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
北京富吉瑞光电科技股份有限公司
Publication Date
2021-03-23

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Abstract

The invention relates to a TEC-based automatic calibration method and device for an infrared thermal imager. During the calibration process of an infrared thermal imager, the suspected pixels in each temperature range of the infrared thermal imager are measured, and the suspected pixels in each temperature range are measured. The pixel is used as the dead point, and the remaining suspected pixels are used as unstable pixels at each temperature point; during use, the processing circuit acquires the image of the infrared thermal imager, completes the non-uniformity correction, obtains the dead point position, and obtains the current temperature; According to the current temperature, look for unstable pixels; directly compensate for the dead point position in the image; judge whether the unstable pixel is a blind pixel, if so, perform compensation, otherwise do not process. The present invention calibrates dead points and unstable pixels for all temperature points and completes non-uniformity correction at the same time. In the process of use, it is not necessary to carry out blind element judgment for each image, and directly adopts corresponding values ​​for dead points and unstable pixels. The compensation method is used for compensation, the processing is simple, and the real-time performance is good.
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Description

technical field

[0001] The invention relates to the technical field of infrared image processing, in particular to a TEC-based automatic calibration method and device for an infrared camera. Background technique

[0002] Due to the inhomogeneity of the semiconductor material used to make the infrared detector, the level of technology, the inhomogeneity of the dark current, the inhomogeneity of the readout circuit, and the ambient temperature, the pixel response of the infrared detector is related to the amount of infrared radiation. It presents a complex nonlinear relationship, which leads to blurred output images of infrared thermal imaging cameras, reduced image quality, and fixed pattern noise, which seriously affects device performance.

[0003] At present, the commonly used correction algorithm adopts a two-point temperature calibration correction algorithm plus a one-point temperature correction algorithm. The two-point calibration will be calibrated and stored in the...

Claims

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