Fault prediction method for penicillin fermentation process based on multivariate time series attention-lstm

A multivariate time series, penicillin fermentation technology, applied in neural learning methods, complex mathematical operations, biological neural network models, etc., can solve problems such as insufficient long-term memory ability, gradient disappearance, gradient explosion, etc., to improve the accuracy and accuracy of system prediction performance and accurate fault prediction

Active Publication Date: 2022-05-24
HEBEI UNIV OF TECH
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AI Technical Summary

Problems solved by technology

However, in the face of long-term sequences, the cyclic neural network is prone to problems such as gradient disappearance, gradient explosion, and insufficient long-term memory capacity.

Method used

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  • Fault prediction method for penicillin fermentation process based on multivariate time series attention-lstm
  • Fault prediction method for penicillin fermentation process based on multivariate time series attention-lstm
  • Fault prediction method for penicillin fermentation process based on multivariate time series attention-lstm

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Experimental program
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Effect test

Embodiment

[0095] 1) Using the penicillin simulation platform Pensim to simulate and generate 20 batches of normal fermentation process data with a sampling time of 400h and a sampling interval of 1h, as the control limit for predicting whether a failure occurs. and SPE cl ; 20 batches of normal fermentation process data with a sampling time of 400h and a sampling interval of 1h and a batch of fault data with a slope of 5% stirring power introduced at a sampling time of 320h were collected as sample data, of which 20 batches of normal fermentation process data were used as sample data. Training set, 1 batch of fault data is used as test set;

[0096] 3) respectively and SPE train The correlation analysis with the online measurable variables in the penicillin fermentation process adopts Pearson (Pearson) correlation analysis, and the analysis results are shown in Table 1:

[0097] Table 1

[0098]

[0099] The present invention selects the on-line measurable process variables wit...

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Abstract

The invention discloses a penicillin fermentation process fault prediction method based on Attention-LSTM of multivariate time series. Firstly, a plurality of relevant process variables in the penicillin fermentation process are selected through Pearson correlation analysis, and then input to LSTM through the Attention mechanism The hidden vectors at different times of the sequence are given different weights, which makes the neural network prediction model more effective in processing long-term sequence inputs, and realizes fault prediction modeling for the penicillin fermentation process. The present invention adopts the failure prediction model combining the attention mechanism and LSTM to predict the failure of the penicillin fermentation process, overcomes the problem that the existing LSTM tends to ignore important timing information when processing long sequence input, and makes the failure prediction based on LSTM more accurate.

Description

technical field [0001] The invention belongs to the field of industrial fermentation production process failure prediction modeling and application, in particular to a penicillin fermentation process failure prediction method based on multivariate time series Attention-LSTM. Background technique [0002] In the actual production process, the fault diagnosis of the system is usually only based on the current situation. However, if the system fault can be predicted early, the fault can be found and eliminated in time before the system fails, which can reduce the number of faults. impact on the system. Therefore, the fault prediction of the system is of great significance to ensure the safety of the system. [0003] A time series (or dynamic sequence) refers to a sequence in which the values ​​of the same statistical indicator are arranged in the order of their occurrence time. Time series analysis is a time domain method that uses parametric models to process ordered random ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/27G06F17/16G06F17/15G06N3/04G06N3/08
CPCG06F30/27G06F17/16G06F17/15G06N3/08G06N3/048G06N3/044
Inventor 梁秀霞庞荣荣杨凡李万通郭鹭陈娇娇
Owner HEBEI UNIV OF TECH
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