Test method, device and system and computer readable storage medium

Abstract

The invention provides a test method, device and system and a computer readable storage medium. The method comprises the steps: acquiring the number N of instruments to be tested, when N is larger than P, the test equipment is configured to be in a first connection relation, and P is the number of first serial ports in the test equipment; wherein the first connection relation is that the first test equipment is in communication connection with external equipment to configure the external equipment, and the second test equipment is in communication connection with the first test equipment to receive state information, fed back by the first test equipment, of the external equipment; and the first test equipment and the second test equipment are enabled to obtain and process test data of the to-be-tested instrument based on the first connection relationship. According to the method, one or more instruments can be tested, testers can flexibly expand the number of the instruments to be tested according to test requirements, the number of channels cannot be increased, and the processing speed of a computer cannot be affected.

Description

technical field [0001] The invention relates to the field of test and measurement, in particular to a test method, device, system and computer-readable storage medium. Background technique [0002] The barometric altimeter is an indirect measuring instrument that uses the barometric sensor as a sensor to sense the atmospheric pressure, and then determines the altitude value according to the functional relationship between the barometric pressure and the altitude. Since the barometric altimeter has special requirements for the test environment, it is necessary to control the thermostat, power supply and air source equipment during the test, so the usual test is designed to be carried out in a temperature-controllable thermostat. Then adjust the thermostat under different temperature conditions, and test its performance and analyze the data by changing the air pressure and making comparisons. [0003] In order to improve the test efficiency of a single test device, the usual ...

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Problems solved by technology

[0004] However, the above solutions bring three problems: first, the complexity of the software is increased; second, due to the limitation of computer performance, the number of tested products is still limited; third, when the test equipment only needs to test a small number of instruments, for example, In the production process, only a single set of products needs to be tested, so in the prior art, the design of maximizing the number of products tested by each test equipment will inevitably lead to waste of resources

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