Non-vision-field single-pixel imaging system and glossy surface defect detection method

An imaging system, single-pixel technology, applied in image analysis, image data processing, instruments, etc., can solve the problems of affecting other areas of inspection, uneven light intensity distribution, etc., to balance the reflected light intensity, suppress highlights, and overcome the phenomenon of specular reflection Effect

Pending Publication Date: 2022-04-12
HEFEI UNIV OF TECH
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Problems solved by technology

Finally, due to the uneven distribution of light intensity due to specular reflection, the camera is saturated at this time, and the highlighted areas in the final image will affect the inspection of other areas

Method used

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  • Non-vision-field single-pixel imaging system and glossy surface defect detection method
  • Non-vision-field single-pixel imaging system and glossy surface defect detection method
  • Non-vision-field single-pixel imaging system and glossy surface defect detection method

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Embodiment Construction

[0032] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments.

[0033] Such as figure 1 As shown, the single-pixel direct imaging based on detector A is to use the spatial light modulator to generate the Fourier base pattern to illuminate the object and use the single-pixel detector to detect the light field intensity from the object, so as to realize the Fourier The leaf space is scanned to obtain the Fourier spectrum of the object image, and then the inverse Fourier transform is performed on the obtained Fourier spectrum, and finally the single-pixel two-dimensional imaging method is realized.

[0034] Howeve...

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Abstract

The invention relates to a non-vision-field single-pixel imaging technology and a glossy surface defect detection method, a system comprises a projector and a detector, and further comprises a diffuse reflection wall, and the diffuse reflection wall is opposite to a mirror-like material; the projector is responsible for coding the substrate pattern and then projecting the coded pattern on the surface of the mirror-like object, the included angle between the light of the projector and the mirror-like material is kept at a set angle alpha, and the focal length and the distance of the projector are adjusted, so that the display definition of the substrate pattern on the mirror-like object meets the set requirement; the detector is used for receiving light reflected by the diffuse reflection wall. According to the non-vision-field single-pixel imaging system and the glossy surface defect detection method, the mirror reflection phenomenon is overcome, the intensity of reflected light is balanced, and a single detector can capture all surface reflected light from a glossy surface at one position; that is, the non-vision-field single-pixel imaging system can perform ideal imaging on the smooth surface under the condition that the non-vision-field single-pixel imaging system is not influenced by the virtual image of the surrounding environment.

Description

technical field [0001] The invention relates to the technical field of glossy surface defect detection, in particular to a non-visual single-pixel imaging system and a glossy surface defect detection method. Background technique [0002] With the development of surface measurement and manufacturing technology, mirror-like materials have been widely used in precision machinery, optical components and chip manufacturing. With the increasing precision of manufacturing in modern industry, in many cases, the difficulty of detecting such smooth surfaces hinders the development of manufacturing technology, and even becomes a bottleneck restricting the manufacture of high-precision objects [0003] At present, the detection methods of glossy surfaces are mainly divided into two categories: one is contact measurement represented by atomic force microscope (AFM). This method has high measurement accuracy, but the contact measurement may damage the measurement surface, the measurement...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06V10/88G06K9/00G02B5/02
Inventor 马孟超苏义龙查沛源邓华夏钟翔
Owner HEFEI UNIV OF TECH
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