Multi-path synchronous focusing and leveling system and method for photoetching machine

A focusing and leveling, multi-channel synchronization technology, applied in the field of lithography machines, can solve the problems of difficulty in guaranteeing the synchronization delay of focusing and leveling points, and increasing software versions, so as to improve synchronization and solve delay problems. Effect

Active Publication Date: 2022-07-01
SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
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  • Claims
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Problems solved by technology

And when the number of cameras that need to collect images increases, that is, when the leveling and focusing points increase, due to the limitation of interfaces and computing power, the number of required boards increases, and the software version will also increase accordingly.
Moreover, in the existing focusing and leveling system, limited by the interface of the image acquisition card, the image data transmission rate and processing rate are determined by the slowest board among the image acquisition board and the multi-point fitting board.
It can be understood that when there are many focusing and leveling points required, it is difficult to guarantee the synchronization delay of each focusing and leveling point

Method used

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  • Multi-path synchronous focusing and leveling system and method for photoetching machine

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[0062] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all structures related to the present invention.

[0063] figure 2 This is a schematic structural diagram of a multi-channel synchronous focusing and leveling system for a lithography machine provided by an embodiment of the present invention. Refer to figure 2 , the multi-channel synchronous focusing and leveling system of the lithography machine includes an image acquisition module 10 and a main control module 20; the image acquisition module 10 includes a plurality of imaging sensors 11, a plurality of analog signal processing modules 12 and a digital signal processing module...

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Abstract

The embodiment of the invention discloses a multi-path synchronous focusing and leveling system and method for a photoetching machine. The system comprises an image acquisition module and a main control module, wherein a plurality of analog signal processing modules in the image acquisition module are electrically connected with the digital signal processing module; the main control module sends an image acquisition instruction to the image acquisition module; the digital signal processing module respectively sends an image acquisition instruction to the plurality of analog signal processing modules according to the same clock signal; the analog signal processing module excites the imaging sensor to acquire image information; and the main control module calculates accurate height data so as to drive the photoetching machine motion table to realize focusing and leveling. According to the invention, the problem of time delay of the existing multi-path image focusing and leveling can be solved, the same clock can be realized from the triggering of the acquisition command to the acquisition and feedback of the imaging sensor, the synchronism and the real-time performance of the image acquisition of the multi-path imaging sensor are improved, and the synchronous configuration of a plurality of focusing and leveling points is ensured.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of lithography machines, and in particular, to a system and method for multi-channel synchronous focusing and leveling of lithography machines. Background technique [0002] A projection lithography machine is a device that projects a mask pattern onto the surface of a silicon wafer through a projection objective lens. During the exposure process of the lithography machine, if the silicon wafer is out of focus or tilted relative to the focal plane of the objective lens, some areas in the exposure field of view will be outside the effective focal depth, which will seriously affect the quality of lithography. Therefore, focus adjustment must be used. Leveling system for precise control. [0003] figure 1 It is the control logic diagram of the existing lithography machine focusing and leveling system, refer to figure 1 , In the common control logic of focusing and leveling, multiple cam...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): H04N5/232G03F7/20
CPCG03F7/20H04N23/60
Inventor陈钰思阳杨宣华
OwnerSHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD