Measuring system and measuring method considering focusing and leveling and precision alignment
A measurement system, focusing and leveling technology, applied in the field of lithography machines, can solve the problems of long production time, high space occupancy rate of lithography machines, and low yield of lithography machines
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[0024] In order to make the objectives, technical solutions, and device advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with the accompanying drawings.
[0025] Reference figure 1 , The measurement system includes a six-degree-of-freedom nano-motion platform 1; a slide table 2, which is mounted on the six-degree-of-freedom nano-motion platform 1, a silicon wafer to be exposed 3; an exposure mask 4, which is fixed by a mask holding device 6; The substrate 5; the mask holding device 6 fixed to the main substrate 5; the alignment mark 7 on the substrate; the gap measurement mark 8 on the mask; the alignment mark area 9 on the mask; the illumination source lens 10; 1. The second X\Y axis translation stage 100\200; the first and second Tz axis rotation stages 101\201 are installed on the first and second X\Y axis translation stages 100\200; Two tilt adapter plates 102\202, respectively installed on the first a...
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