Device for determining example dielectric characteristic, measuring method and applications thereof

Abstract

The invention relates to an instrument, method and application for accurately measuring the dielectric properties of sample materials. The device comprises a mandrel 1, an inner electrode 2, a sample layer 3, an outer electrode 4, an insulating gasket 5, an inner electrode lead 6a and a guard electrode lead 6b, 6c, and the length of the inner electrode 2 is adjustable; The inner electrode 2, the sample layer 3 and the outer electrode 4 are sequentially sleeved on the outside of 1, and the two ends of the inner electrode 2, the sample layer 3 and the outer electrode 4 are provided with fastening structures; one end of the inner electrode lead wire 6a and The internal electrodes 2 are connected. The dielectric sample is installed in a coaxial type capacitor. The inner electrode of the coaxial capacitor adopts the structure of the guard electrode type to eliminate the influence of the edge effect. The length of the effective electrode is variable, so that the capacitance is basically the same when the sample is placed with a medium and when the sample is removed without a medium. Therefore, by measuring the length of the effective electrode change and related calculations, the determination of the dielectric properties of the sample can be realized.

Description

Technical field: [0001] The invention belongs to the measurement of dielectric properties in the field of electrical measurement, in particular to an instrument, method and application for accurately measuring the dielectric properties of sample materials. Background technique: [0002] The dielectric properties of insulating materials have important value for the application of materials. In industry, the dielectric loss value component in the dielectric properties causes energy loss and even equipment damage. In the manufacture of precision instruments, accurate data on dielectric properties is also important, and sometimes even critical, for the performance of the instrument. Consequently, a number of methods for measuring dielectric properties have been developed over the years. However, these methods currently have some disadvantages: [0003] 1. Usually only flat-shaped samples can be measured, and there are requirements for the size of the sample, and the sample ar...

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Problems solved by technology

Therefore, the above method of measuring dielectric properties has some fundamental defects.

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