Device for determining example dielectric characteristic, measuring method and applications thereof

Abstract

The present invention relates to an instrument, a method and the application for accurately measuring dielectric properties for a sample material. The instrument comprises a core shaft 1, an inner electrode 2, a sample layer 3, an outer electrode 4, an insulating washer 5, an inner electrode lead 6a, a guard electrode lead 6b and a guard electrode lead 6c. The length of the inner electrode 2 can be adjusted. The inner electrode 2, the sample layer 3 and the outer electrode 4 are covered outside the core shaft 1 in order. Two ends of the inner electrode 2, the sample layer 3 and the outer electrode 4 are provided with a fastening structure. The inner electrode lead 6a is connected with the inner electrode 2. A medium sample is arranged in a coaxial type capacitor. The inner electrode of the coaxial type capacitor uses the guard electrode structure to eliminate the influence of edge effect. The length of an active electrode is changeable, so the capacities in the two situations of placing sample with medium and moving sample without medium are basically same. So the measurement of sample dielectric properties can be realized through measuring the changed length of the active electrode and the relevant calculation.

Description

Technical field: [0001] The invention belongs to the measurement of dielectric properties in the field of electrical measurement, and particularly relates to an instrument, method and application for accurately determining the dielectric properties of sample materials. Background technique: [0002] The dielectric properties of insulating materials are of great value to the application of materials. In industry, the dielectric loss value component in the dielectric properties causes energy loss and even equipment damage. In the manufacturing of precision instruments, accurate data on dielectric properties are also very important to the performance of the instrument, and sometimes even critical. Therefore, many methods for measuring dielectric properties have been developed over the years. However, these methods currently have some shortcomings: [0003] 1. Generally, only flat-plate samples can be measured, and the size of the sample is required, and the sample area cannot be too...

AI Technical Summary

Problems solved by technology

Therefore, the above method of measuring dielectric properties has some fundamental defects.

Images