Method for testing signal-to-noise ratio of wavelength division multiplexing system

A technology of optical signal-to-noise ratio and wavelength division multiplexing, applied in the direction of wavelength division multiplexing system, etc., can solve the problem that the optical signal-to-noise ratio of WDM system cannot be measured correctly

Inactive Publication Date: 2011-03-02
ZTE CORP
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Problems solved by technology

[0008] The problem to be solved by the present invention is that the existing spectrum analyzer cannot correctly measure the optical signal-to-noise ratio of a WDM system using a multi-channel narrow-band dispersion compensator. The present invention proposes a test method for the optical signal-to-noise ratio of a wavelength division multiplexing system

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  • Method for testing signal-to-noise ratio of wavelength division multiplexing system
  • Method for testing signal-to-noise ratio of wavelength division multiplexing system
  • Method for testing signal-to-noise ratio of wavelength division multiplexing system

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Embodiment Construction

[0035] Combine below image 3 Describe the test method of the optical signal-to-noise ratio of the WDM system. The specific steps are as follows:

[0036] Step 110, selecting a spectrum analyzer with high resolution, high dynamic range and high wavelength precision for spectrum measurement;

[0037] When measuring the system receiving end spectrum of a multi-channel narrow-band dispersion compensator, it is advisable to select high resolution (determining the wavelength and power entering the photodetector, and the ability to distinguish adjacent wavelengths), high dynamic range (measurement of weak signals near strong signals) Spectrum analyzer with high wavelength accuracy (measurement wavelength relative to the actual wavelength) for spectrum measurement, set the corresponding measurement parameters of the instrument, the recommended resolution is at least 0.01nm, which is conducive to the measurement application of multi-channel narrow-band dispersion compensation The rea...

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Abstract

The present inventionrelates to a testing method of a WDM system light signal-to-noise. First, choose a spectroanalysis instrument to measure the spectrum, and then find the left edge point Lambada L 1 and the right edge point Lambada R 1 of the signal bandwidth as well as the left edge point Lambada L 2 and the right edge point Lambada R 2 of the chromatic dispersion bandwidth, counte the power medium value Pn Lemean and the Pn Rmean respectively in the left interval[Lambada L 2 Lambada L 1] and the right interval[Lambada R 1 Lambada R 2], and worke out the yawp power Pres in the resolving capability BRES which is on the position of the signal wavelength, choose the yawp power P yawp power in the yawp bandwidth Bzs as well as the yawp power in the signal bandwidth and the yawp power P inthe signal bandwidth B; second, count the total power in the signal bandwidth by the power spectral density Pd integral; and finally, count the signal-to-noise based on the signal power and the yawp power.

Description

technical field [0001] The invention relates to a method for testing the optical signal-to-noise ratio of a wavelength division multiplexing system, in particular to a method for monitoring the optical signal-to-noise ratio of a wavelength division multiplexing system in the field of optical communication. Background technique [0002] With the rapid development of wavelength division multiplexing WDM systems in the direction of ultra-long, high-speed, and high-density, various new dispersion compensators, especially the emergence of multi-channel narrow-band dispersion compensators, have greatly improved the dispersion compensation level of the system and improved the performance of the system. transmission capability, but the dispersion compensation technology of special devices will lead to large errors in the monitoring of the optical signal to noise ratio, which brings difficulties to the monitoring of the optical signal to noise ratio of the system. [0003] figure 1 ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04J14/02
Inventor 沈百林
Owner ZTE CORP
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