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Test holder for microchip

A chip and micro technology, applied in the direction of single semiconductor device testing, semiconductor/solid-state device testing/measurement, measurement devices, etc., can solve problems such as damage to microchips, distortion of aging test results, etc.

Inactive Publication Date: 2009-11-18
TE CONNECTIVITY GERMANY GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, especially for "burn-in tests", it is necessary that the microchip is pressed evenly in the contactor, since an uneven load on the microchip can lead to distorted burn-in test results or even damage the microchip

Method used

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Examples

Experimental program
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Embodiment Construction

[0057] First, the structure and function of the base 1 according to the present invention will be referred to figure 1 Exemplary embodiments are described. figure 1 The base 1 is shown in plan view A and side view S. FIG. As is clear from plan view A, the base 1 has a substantially rectangular outline. Base 1 presents a central opening 2 enclosing a socket for a microchip, through which opening the microchip can be inserted into a contact (not shown in the figure). As clearly seen from the side view, the central opening 2 is formed as a hole through the base 1 .

[0058] Shown at the side 3 of the base 1 are two sockets 4, 5 which are part of a pivot bearing Bf connecting the base 1 to a hold-down mechanism 6 (not shown here). As is clearly visible from the side view S, the sockets 4 , 5 are formed in the outer region of the side 3 , ie on opposite ends of the side 3 , and protrude beyond the base 1 in the height direction h. Between the sockets 4, 5, a groove 7 is provide...

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PUM

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Abstract

The invention relates to a test holder (H) for fixing the position of a microchip in a microchip contactor, having a base frame (1) and a pressing unit (6), which is connected to the base frame (1) such that it can be pivoted open or shut and which comprises a pressure body (11) designed to interact with the microchip. In order to press the microchip all over with a uniform pressure onto the contactor, even if the microchip is inclined with respect to the pressing means (6) when it is contacted with the contactor, the invention provides that the pressure body (11) may be tilted about a first and a second tilting axis (T1, T2).

Description

technical field [0001] The present invention relates to a test holder for at least one microchip having a base comprising at least one central opening surrounding at least one socket for a microchip and having a press connected to the base by a pivot bearing. A tightening mechanism is provided so that the pressing mechanism can be pivotally opened about a pivot axis in a direction away from the central opening, and pivotally closed in a direction toward the central opening. Background technique [0002] Test mounts for microchips are well known and are often used to hold the microchip in place on sockets or contacts designed for electrical contacting of the microchip. In particular, if the microchip comprises electrical contacts placed on corresponding contacts of the contactor, the above-mentioned pressing mechanism is used. [0003] The above-mentioned microchip contacts are, for example, so-called ball grid array packages or grid array packages, in which the microchip co...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04
CPCG01R1/0466G01R31/26H01L22/00
Inventor C·克勒
Owner TE CONNECTIVITY GERMANY GMBH