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Preparation method of transmission electron microscope specimen

A transmission electron microscope and sample technology, which is applied in the preparation of test samples, electrode system manufacturing, discharge tube/lamp manufacturing, etc. TEM imaging resolution and other issues, to achieve the effect of low contrast noise and high resolution

Active Publication Date: 2011-03-23
TSINGHUA UNIV
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Problems solved by technology

[0003] However, in practical applications, due to the large contrast noise of the amorphous carbon film, it has a great influence on the improvement of the resolution of the TEM imaging of nanoparticles. Therefore, the TEM sample prepared by the above method is used for TEM observation When nanoparticles are used, a satisfactory resolution of TEM imaging cannot be achieved

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  • Preparation method of transmission electron microscope specimen
  • Preparation method of transmission electron microscope specimen
  • Preparation method of transmission electron microscope specimen

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preparation example Construction

[0016] see figure 1 , the preparation method of the TEM sample of the embodiment of the present invention mainly includes the following steps:

[0017] Step 1, dispersing a certain amount of nanoparticles to be tested and a certain amount of graphene sheets in a solvent to form a sample dispersion to be tested.

[0018] In this embodiment, the preparation method of the dispersion of the sample to be tested specifically includes: providing a certain amount of nanoparticles to be tested, a certain amount of graphene sheets, and a solvent; placing the nanoparticles to be tested and the graphene sheets into the solvent to form A mixture; the mixture is ultrasonically oscillated to uniformly disperse and suspend the nano particles and graphene sheets to be tested in the solvent, thereby obtaining a sample dispersion to be tested. In this example, the mixture was shaken in an ultrasonic shaker for about 15 minutes. It can be understood that other methods can also be used to disper...

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Abstract

The invention relates to a preparation method of a transmission electron microscope specimen, which comprises the following steps: dispersing a certain number of nanoparticles to be tested and a certain number of graphene sheets into a solvent to form dispersion liquid for the specimen to be tested; providing a transmission electron microscope micro-grid of a carbon nanotube membrane structure with partial suspended arrangement; soaking the carbon nanotube membrane structure of the transmission electron microscope micro-grid with the dispersion liquid for the specimen to be tested; and drying the dispersion liquid for the specimen to be tested to finally obtain the transmission electron microscope specimen.

Description

technical field [0001] The invention relates to a method for preparing a transmission electron microscope sample. Background technique [0002] In a transmission electron microscope, a powder sample is usually carried by a TEM microgrid, and the powder sample to be tested and the TEM microgrid used to carry the powder sample together constitute a TEM sample. The preparation method of the existing TEM sample comprises: dispersing the sample particles to be tested in ethanol or other solvents to form a dispersion; adding the dispersion to the surface of a TEM microgrid; and drying the TEM microgrid surface, forming a transmission electron microscope sample. In the prior art, the microgrid applied to the transmission electron microscope is usually made by covering a metal grid such as a copper grid or a nickel grid with a porous organic film, and then vapor-depositing a layer of amorphous carbon film. In the transmission electron microscope sample prepared by using the transm...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28H01J9/00G01N23/04
CPCH01J2237/201G01N1/38H01J37/20H01J2237/31745
Inventor 姜开利张丽娜张昊旭范守善
Owner TSINGHUA UNIV
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