High-precision optical stripe phase extraction method
An extraction method and high-precision technology, applied in the field of optical measurement, which can solve the problems of narrow window, inability to guarantee, and inconvenient actual operation.
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[0085] The method of the invention is used to extract the phase of the optical fringes obtained in the structured light projection profilometry, thereby realizing the surface profile measurement. Figure 7 is the structured light projection optical fringe map, which is the optical fringe map obtained by the structured light projection of the face. Figure 8 For the phase extraction method of the present invention to Figure 7 The phase map extracted from the optical fringe pattern of the structured light projection of the area in the middle box. Figure 9 based on Figure 8 Reconstructed lips contour. Figure 10 For the traditional Fourier transform phase extraction method, the Figure 7 The phase map extracted from the optical fringe pattern of the structured light projection of the area in the middle box. Figure 11 based on Figure 10 Reconstructed lips contour. Figure 12 Phase extraction method for wavelet transform pair Figure 7 The phase map extracted from the o...
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