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Wireless sensor network testing node with microdrive and data synchronizing capacity

A wireless sensor and micro-hard disk technology, applied in the field of perception and measurement and control, can solve the problem that test data cannot be collected at high speed for a long time, large-capacity storage and verification

Inactive Publication Date: 2013-06-05
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] Aiming at the problem that test data cannot be collected at high speed for a long time, stored in large capacity and verified in the existing wireless sensor network test technology, the present invention provides a wireless sensor network test node with micro hard disk and data synchronization capability, which can realize large High-speed acquisition and real-time reliable storage and return of capacity wireless test data

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  • Wireless sensor network testing node with microdrive and data synchronizing capacity
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  • Wireless sensor network testing node with microdrive and data synchronizing capacity

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Embodiment Construction

[0019] A further detailed description will be given below based on the accompanying drawings, which are only schematic illustrations of the present invention and are not intended to be limiting. in:

[0020] The asynchronous clock condition refers to the situation that the integrated functional modules inside the FPGA need to be driven by different frequency clocks. The asynchronous data flow referred to refers to the data loss and congestion caused by inconsistent data throughput between modules under this condition. Taking a working frequency of the wireless test node described in this article as an example (only for illustrative frequency, the specific frequency value is variable), the FPGA itself uses a 20MHz crystal oscillator drive, the AD sampling controller uses a 2.5MHz crystal oscillator drive, and the Nios II soft core uses Driven by 50MHz, the system SDRAM needs to be driven by a clock with the same frequency as Nios II but with a different phase. The MicroSD card...

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Abstract

The invention discloses a wireless sensor network testing node with microdrive and data synchronizing capacity, which belongs to the technical field of sensing, measurement and control, wherein data tested by a sensor module is transmitted to an AD (Analog-to-Digital) conversion module; the AD conversion module is used for transmitting the data to a sampling controller module in a microdrive controller after modulating and converting the signal; the sampling controller module is used for controlling the AD conversion module to transmit testing data to an asynchronous FIFO (First In First Out)cache; after the asynchronous FIFO cache is full, the data is read out from the asynchronous FIFO by a writing controller and written into a storage medium in the form of a file under the support of a file system; and when a wireless communication module needs to read the data, the data is read out from the storage medium by a reading controller and wirelessly transmitted. By using the wireless sensor network testing node disclosed by the invention, high speed sampling-data file management-microdrive reading / writing-wireless transmission data stream synchronization can be realized under asynchronous clock condition in the testing process.

Description

technical field [0001] The invention belongs to the technical field of perception and measurement and control, and relates to a wireless network test node with a microhard disk and an asynchronous clock data synchronization capability. Background technique [0002] Reliable collection of test data and storage of large amounts of data are the most concerned issues in the field of distributed testing. [0003] Commonly used distributed test methods include wired test method, storage test method and wireless test method. [0004] Due to the existence of external signal lines, the installation of the test sensor is extremely inconvenient. At the same time, the noise signal is easy to interfere with the useful signal through the signal line and reduce the test accuracy. In test applications where the installation space is narrow and there is relative movement, the installation and design of the test equipment is inconvenient, and it may also bring safety hazards during the test...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G08C17/02H04W56/00H04W84/18G11C29/56
Inventor 宋萍李科杰陈昌
Owner BEIJING INSTITUTE OF TECHNOLOGYGY