Micro/nano-particle sample carrying mesh storage device for transmission electron microscope, and sample preparation method

Abstract

The invention provides a micro / nano-particle sample carrying mesh storage device for a transmission electron microscope. The micro / nano-particle sample carrying mesh storage device comprises a clamping handle, a sample carrying mesh and a bottom tray, wherein the bottom tray is provided with a hollow part; the sample carrying mesh is arranged in the hollow part; a clearance is formed between the sample carrying mesh and the edge of the hollow part; the clearance is a flow guide and observation hole; and the clamping handle is connected with the bottom tray, is used for clamping the bottom tray, and is fixed on a matched base is matched with the bottom tray and the clamping handle in shape. The micro / nano-particle sample carrying mesh storage device for the transmission electron microscope has the advantages that in a sample preparation process, the novel carrying mesh and a storage grid are cooperatively used, and the carrying mesh is suspended in the storage grid; and during the fixation of the carrying mesh, the contact between the carrying mesh and each of other solid media is avoided, and the distribution situation of particle samples on the carrying mesh can be directly observed by using bottom light of an optical microscope. Therefore, three defects of the conventional preparation method are overcome, and the sample preparation efficiency is improved.

Description

technical field [0001] The invention relates to a method for preparing micro-nano particle samples for a transmission electron microscope, and belongs to the technical field of quality detection of micro-nano particle materials. Background technique [0002] For particles of micron and nanometer size, transmission electron microscope is one of the few effective detection tools for observing and detecting their microscopic appearance, structure and chemical composition. When using a transmission electron microscope for observation and analysis, the particle sample must be placed on the microscope-specific grid support film, so it is necessary to use a suitable method to disperse the sample on the grid support film before observation. The density and uniformity of sample distribution on the grid support film will directly affect the quality of micrographs. [0003] At present, the common preparation method of micro-nano particle samples for transmission electron microscopy is...

AI Technical Summary

Problems solved by technology

However, there are many uncontrollable factors in this method, the most prominent three points are: 1. In addition to contacting the sample, the carrier net is also in contact with the filter paper. If the filter paper contains impurities, it may contaminate the sample; 2. The carrier net is only placed on the filter paper On the other hand, there are no other fixing measures, so during the preparation process, such as when the suspension is dripped or the external air flow changes, the carrier net may be moved or turned over, resulting in the failure of sample preparation; 3. Due to the existence of filter paper, it is impossible to use optical The bottom light of the microscope can effectively observe the distribution density of the sample on the grid, so that it is impossible to effectively determine the appropriate amount of suspension to add, and the efficiency of sample preparation is not high

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