The invention relates to a transmission electron microscope sample table for observing a three-dimensional atom probe test sample. The transmission electron microscope sample table comprises a sample rod main body, a press part, an automatic reset device and guide rails, wherein the guide rails are connected to one end of the sample rod main body, a groove opening is formed in the end of the sample rod main body, an arc bottom groove is formed in the axial center of the groove opening, a rectangular step is arranged at the groove opening of the bottom groove, a stepped through hole is formed in the tail end of the bottom groove, the press part comprises a press block and an eccentric wheel, the eccentric wheel is used for pressing the press block, an arc groove body is formed in the press block, is symmetric to the bottom groove of the sample rod main body and has the same shape as the bottom groove, a guide boss of the press block is arranged in the stepped through hole, the automatic reset device is a spring, and the guide boss passes through the spring. The transmission electron microscope sample table is simple in structure and is convenient to process and maintain, large-angle rotation in an inclination way can be achieved, the three-dimensional atom probe test sample can be directly loaded, the transmission electron microscope sample table can be used as a three-dimensional reconstruction sample rod of a transmission electron microscope, and the acquired transmission electron microscope image can be used for directly correcting a data reconstruction result of a three-dimensional atom probe.