Method for preparing transmission electron microscope thin film sample of longitudinal section of filament by electrolysis double-spray method

A technology of electrolytic double spraying and transmission electron microscopy, which is applied in the preparation of test samples, etc., to achieve the effects of reducing use, reducing costs, and improving the success rate of sample preparation

Inactive Publication Date: 2013-10-02
SHOUGANG CORPORATION
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Problems solved by technology

[0005] The purpose of the present invention is to provide a method for preparing a filament longitudinal section transmission electron microscope fil

Method used

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  • Method for preparing transmission electron microscope thin film sample of longitudinal section of filament by electrolysis double-spray method
  • Method for preparing transmission electron microscope thin film sample of longitudinal section of filament by electrolysis double-spray method
  • Method for preparing transmission electron microscope thin film sample of longitudinal section of filament by electrolysis double-spray method

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Embodiment 1

[0016] Embodiment 1: organization is the preparation of the longitudinal section thin film sample of pure ferrite

[0017] (1) Cutting the sample: the sample structure is pure ferrite, the aluminum oxide 40A15 cutting wheel is selected according to the microhardness value of the sample, the preset feed speed is 0.060 mm / s, the cutting load is adjusted to medium strength, and the cutting wheel speed is adjusted to 2500 rpm. The filaments were cut into three small sections of 2.8 mm, 2.9 mm, and 3.0 mm in length.

[0018] (2) Grinding samples: use flat frosted glass as the grinding and polishing plane, press a filament with a square rubber, grind a plane on 800# water sandpaper, and grind the second and third filaments in the same way. Silk. Stick the flat side of the three filaments side by side on the 10x20mm ground glass with 502 glue. After the sample is firmly pasted, use 800# water sandpaper to grind the opposite side on the flat ground glass. The two planes of the sampl...

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Abstract

Provided is a method for preparing a transmission electron microscope thin film sample of a longitudinal section of a filament by the electrolysis double-spray method and belongs to the transmission electron microscope sample preparation field. By utilization of the electrolysis double-spray method and aperture samples with a diameter of 3.0 mm, longitudinal section thin films of filament samples with a diameter of 1.0 mm are prepared successfully, and the structure analysis and second phase analysis are performed by utilization of a transmission electron microscope. The samples are prepared after steps of cutting, grinding, clamping, adjustment of beams, electrolysis double-spray and cleaning. The method is advantaged in that two sides of the longitudinal section of a filament sample are polished and thinned by an electrolysis double-spray instrument at the same time, the polishing and thinning time is only 10 s-2 min, and the structure and secondary phase can be obtained accurately. The method reduces the use of parts of sample preparation devices, reduces the cost, and raises the sample preparation efficiency and success rate.

Description

technical field [0001] The invention belongs to the technical field of transmission electron microscope sample preparation, and in particular provides a method for preparing a filament longitudinal section transmission electron microscope thin film sample by electrolytic double spraying. Background technique [0002] To analyze the microstructure, grain boundaries, dislocations, and second phase components of metal sample micro-regions by transmission electron microscopy, a well-prepared thin film sample is required. The most commonly used methods for the preparation of thin film samples are ion thinning method and electrolytic double spray method. The ion thinning method is to cut the sample and manually grind it to a thickness of 50 μm to 80 μm, then pass through a high-precision pit instrument and polish it to a thickness of <20 μm in the center of the sample, and then put it into the ion thinning instrument for the center of the sample. Argon ion bombardment for seve...

Claims

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Application Information

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IPC IPC(8): G01N1/28G01N1/32
Inventor 郝京丽鞠新华孟杨蔡宁
Owner SHOUGANG CORPORATION
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