45results about How to "Improve the success rate of sample preparation" patented technology

The invention discloses a method for preparing transmission microscope samples on the basis of non-precision positioning, and belongs to the technical field of semiconductors. The method includes providing failure analysis chips and positioning and labeling failure points in the failure analysis chips to obtain labeled zones; cutting a side of each labeled zone to form first wedge-shaped cavitiesand thinning the sections, which are close to the labeled zones, of the first wedge-shaped cavities until the failure points can be observed; forming protective layers on the sections where the failure points are observed; cutting the other side of each labeled zone to form second wedge-shaped cavities and thinning the sections, which are close to the labeled zones, of the second wedge-shaped cavities until primary samples with preset thicknesses are obtained; carrying out U-shaped cutting-off on the bottoms of the primary samples and then thinning the primary samples to obtain the transmission microscope samples. The method has the advantages that the failure points can be effectively prevented from being cut by mistake, each cut surface with the corresponding failure points can be prevented from being damaged or stained by splashing in follow-up processes, accordingly, the sample preparation success rate can be increased, and observation results can be improved.

The invention discloses a method for testing the interfacial bonding strength of a ceramic fiber-reinforced resin matrix composite material and relates to ceramic fibers. The method comprises the following steps: bonding the ceramic fibers to a hard paper frame by virtue of an instant adhesive, for straightening and solidifying the ceramic fibers; preparing an embedding mold, putting the ceramic fibers and the hard paper frame into the embedding mold, and introducing resin into the embedding mold; after the resin is solidified, cutting an embedded end together with the embedding mold so as to obtain a sample, and polishing; when the embedding depth of the sample is lower than 1mm, bonding the embedded end with a primary cut part by virtue of quick-dry resin after the polishing process; burning out two sides of the paper frame at an un-embedded end by virtue of naked flame, averagely cutting the upper end of the paper frame according to the quantity of the ceramic fibers, and bonding and reinforcing the paper frame by virtue of a hard paperboard with area equal to that of the cut paper frame; firstly fixing the embedded end at a lower clamp of a testing machine, and then fixing a reinforcing section to an upper clamp of the testing machine; carrying out a single-filament draw-out experiment; recording each withdrawal force value given by a testing machine; observing the shape of an withdrawn end, and measuring the maximal withdrawing length of the single fiber; and calculating the interfacial bonding strength between the fiber and the resin.

The application relates to a spiral-downward undisturbed soil triaxial sample maker, and belongs to the technical field of the indoor soil engineering testing of the civil engineering subject. The sample maker comprises a support mechanism, a cutting mechanism, and a sample bearing mechanism; the lifting of the cutting mechanism is driven by two lifting shafts, two wedge-shaped detachable cuttingblades replace the manual cutting, the cutting blades with two different diameters are used for cutting the soil sample into the cylinder samples required by the test in twice; a cutting speed switchis turned off after the sample making is accomplished, a cutting turntable is ascended to take out the made sample. The undisturbed soil cannot be disturbed in the cutting process, the influences of uncertain factors and artificial factors in the soil cutting process are avoided, and the sample making can be precisely and efficiently accomplished; compared with a soil cutter of undisturbed soil inthe existing laboratory, the sample making efficiency is doubled, and the sample making time is about 15min.

The invention discloses an X-luminoscope fusion sample preparation method, comprising the following steps: grinding a solid sample into powder of not less than 200 meshes for later use, wiping a crucible, a stirrer and a medicine spoon to be clean by using alcohol, placing in an oven for drying for 30min and more, taking out and placing on a tray, wiping the inner wall of a die to be clean by using alcohol, naturally withering for later use; weighing a certain mass of PE material to be put into a crucible, heating until the solvent is completely fused; weighing a certain mass of sample powder in S1 to place in a crucible in the S4, turning on the stirrer, stirring while heating, stopping stirring and heating after 30min; fetching melt at the upper layer in the crucible in S5 with a medicine spoon in a die in the S3, wherein the melt is about 2 / 3 of the height of the die, naturally cooling to completely solidify to obtain the sample sheet. The borate flux is replaced by the PE material, the manufactured sample sheet is hard to break, crack and pollute, easy to de-mold and store, the sample preparation time is effectively shortened, and the sample preparation cost is greatly reduced.

The invention discloses a method determining impurity content in a stannic oxide electrode material. The method comprises: adding the stannic oxide electrode into lithium tetraborate and lithium metaborate serving as a flux and mixed proportionally for melting, taking a fuse piece after cooling, adding water and inorganic strong acid to dissolve to obtain a solution to be determined, and then determining the solution to be determined by adopting an inductive coupling plasma emission spectrometer. By adopting the method disclosed by the invention, the high compactness stannic oxide electrode material can be fully dissolved, sampling is simple, various impurity elements in the stannic oxide electrode can be determined, a determined result is accurate and an analysis error is small.

A briquette sample preparation device, characterized in that it includes a column, an upper panel, a lower panel, a middle panel, a pad, a hollow cylinder, a lower part of the chassis, an upper part of the chassis, a jack, and a jack piston rod; the lower part of the chassis and the upper part of the chassis Consolidation into one body; the inner surface of the hollow cylinder is smooth; the pads can be fully extended into the cylinder and are in close contact with the inner wall of the cylinder; there are four columns in total, the columns penetrate the middle panel, and the two ends are respectively fixed On the upper and lower panels; the jack is placed in the center of the lower panel. The briquette sample preparation device can independently complete sample preparation, is easy to operate, requires less labor, and has a high success rate of sample preparation.

The application relates to a spin-down type undisturbed soil triaxial sample preparation device, which belongs to the technical field of indoor geotechnical testing in the discipline of civil engineering. It includes a support mechanism, a cutting mechanism, and a sample-holding mechanism; the present invention drives the cutting mechanism up and down through two lifting shafts, six wedge-shaped detachable cutting blades replace manual cutting, and uses two kinds of cutting blades with different diameters to divide the soil sample Cut the cylindrical sample required for the test twice. After the sample preparation is completed, turn off the cutting speed switch, raise the cutting turntable, and take out the prepared sample. The present invention will not disturb the undisturbed soil during the cutting process, avoiding Influenced by uncertain factors and human factors in the soil cutting process, the sample preparation can be completed accurately and efficiently. Compared with the undisturbed soil cutter in the existing laboratory, the sample preparation efficiency is increased by 2 times, and the sample preparation time is about 15 minute.

The invention provides a method for preparing a failure analysis sample and a failure analysis sample. The preparation method includes the following steps: providing a stacked package to be analyzed, wherein a plurality of stacked bare chips are arranged in the stacked package, and each bare chip has an The front side of the pad and the back side opposite the front side, the back side of the die is in contact with the front side of its adjacent die, and the pads of the die are electrically connected to the pads of the adjacent die; remove other die until the pads of the die adjacent to the target die are exposed; the exposed pads are electrically drawn out to form a sample for failure analysis. The advantage of the present invention is that the removal operation is performed on the back of the target die, and the non-target die pad is used as an electrical connection, thereby avoiding the removal operation on the front side of the target die with circuit devices, protecting the front circuit devices, and being able to A complete and non-damaged target die is prepared, which greatly improves the success rate of sample preparation and greatly reduces the difficulty of sample preparation.

The invention discloses a method for preparing a replica sample extracted by a nanoscale carbide transmission electron microscope. The steps are: mechanically grinding and polishing the sample until the surface is smooth and free of scratches; into alcohol for cleaning, and then take it out for drying; wherein, the corrosion solution is a mixed solution of picric acid, bromic acid and methanol; use a vacuum coating instrument to spray a layer of carbon film on the surface of the sample; the carbon film on the surface of the sample Divided into a grid shape, electrolyzed in the electrolyte, the surface of the sample is inclined, so that the carbon film is separated from the surface of the sample; wherein, the electrolyte is a mixed solution of nitric acid, bromic acid, and absolute ethanol; The membrane was removed from the electrolyte, rinsed in alcohol, and dried on filter paper or air-dried. The carbon extraction replica sample produced by the invention has good carbon film shape and high sample preparation success rate, and is suitable for observing very small nanoscale carbides with a transmission electron microscope.

The present invention relates to the field of semiconductor technology, in particular to an automatic sample thinning method; including: step S1, providing an initial sample with a defect; step S2, forming two defects on the surface of the initial sample avoiding the defect The two parallel extension lines on the side edge are the starting lines, and the groove width extends to both sides of the two grooves; step S3, filling the two grooves with a metal different from the initial sample; step S4, using focused ion Beam technology thins both sides of the sample filled with metal, and monitors the returned particle composition in the thinning process in real time during the thinning process; step S5, the composition of the different metals in the monitored particle composition When the ratio is lower than a preset value, the thinning operation will be stopped; the cutting position of the focused ion can be precisely controlled, and the sectioning accuracy can be improved. At the same time, the degree of automation is high, the efficiency is high, the labor cost is low, and the success rate of sample preparation is high.

The invention discloses a nano-film transmission electron microscope in-situ heating chip sample preparation method. The method comprises the following steps: (1) selecting a liquid injection device;(2) cleaning and fixing the liquid injection device; (3) bending one end of a copper wire into a copper ring; (4) moving the copper ring to a position near the thin film sample, and fishing up the thin film sample to the copper ring; (5) extruding a liquid drop from the liquid in the microsyringe; (6) moving the copper ring to a position near the liquid drop at the tip of the microsyringe, so thatthe film sample is adsorbed on the liquid drop; (7) accurately adsorbing the liquid drops in a sample observation area, and then moving away the microsyringe; (8) naturally drying the chip; and (9) heating and baking the naturally dried chip. Accurate titration of the nano-film in the Si3N4 film observation area in the transmission electron microscope in-situ heating chip can be realized, hydrophilic treatment on the Si substrate is not needed, the cost is reduced, the influence of surface tension on the film is avoided, the sample preparation success rate is improved, and the risk of damageto a chip electrode is reduced.

The invention discloses a method for preparing a section sample of a micron-scale sheet transmission electron microscope. In the present invention, the micron-scale thin slice sample is first cut into rectangular sample strips and clamped in the solidified sample sheet to form a block sample, and then cut into a cross-sectional sample thin slice, a sample holder is attached to the surface of a cross-sectional direction, and the two surfaces are manually ground. The other surface is bonded to the support ring by a curing adhesive, and then heated to remove the sample holder, and at the same time the support ring is cured and bonded to the cross-section sample sheet, and then the sample is trimmed, and finally ion thinning is carried out to obtain a TEM cross-section sample; the preparation of the present invention The method has the advantages of simple operation process, mature sample preparation equipment and technology, high sample preparation success rate, strong practicability, and is suitable for the preparation of various micron-scale flake-shaped TEM cross-sectional samples.

The application relates to a sample preparation process of a spin-down type undisturbed soil triaxial sample, which belongs to the technical field of indoor geotechnical testing of the civil engineering discipline. The rotary cutting method is used for sample preparation. First, calculate the liquid index of the soil according to the soil data, and then select the corresponding cutting blade speed, and then place the soil sample on the nail plate, and control the lifting switch and cutting speed. switch to make the cutting blade complete lifting and rotating. When the cutting blade rotates, a circle with a larger diameter is formed at the cutting edge, and the original soil sample is cut through the self-rotation and lifting of the cutting blade to complete the production of the sample; The invention greatly simplifies the operation steps, does not disturb the undisturbed soil during the cutting process, avoids the influence of uncertain factors and human factors in the cutting process, and completes the sample preparation accurately and efficiently; compared with the existing laboratory The undisturbed soil cutter, its sample preparation efficiency is increased by 2 times, and the sample preparation time is about 15 minutes.

The invention discloses a lifting type sample preparation technology for a tri-axial sample of undisturbed soil. The technology comprises the steps as follows: firstly, according to characteristics ofa soil sample, the hardness of the soil sample is judged, and the cutting rotation speed of a cutting mechanism is determined; then the soil sample is placed on a lifting mechanism and can be drivenby the lifting mechanism to rise, the soil sample rising gradually is cut through rotation of a cutting blade of the cutting mechanism, and preliminary preparation of the tri-axial sample is completed; and finally, the height of the lifting mechanism is reduced, the sample is taken out and is treated according to the required height, and the sample preparation is completed. According to the technology, the problems that operation steps are tedious, the influence caused by the operation proficiency of sample preparation persons is large, the sample preparation efficiency is low, the disturbanceto the soil sample is large, the success rate of sample preparation is not high and the like in existing sample preparation processes are solved.

The present invention discloses a sample preparation method of a nano-material transmission electron microscope in-situ heating chip, and the method comprises the following steps: (1) cleaning a liquid injection device; (2) connecting one end of a Peek tube with one end of a hollow glass needle tube; (3) fixing the hollow glass needle tube to a micromanipulator; (4) drawing a liquid sample with a syringe; (5) removing a liquid suction needle and connecting the other end of the Peek tube with the syringe; (6) putting an in-situ heating chip on an objective table of a microscope; (7) moving the hollow glass needle tube until the position of a tip needle corresponds to a Si3N4 film to be loaded; and (8) injecting, along the Peek tube, a nano material liquid into the hollow glass needle tube by the syringe, and dispersing the nano material liquid through the tip needle onto the Si3N4 film to be loaded. The method can accurately titrate a sample solution, simple preparation is sample, cost can be reduced, comparative experiments on one chip are facilitated, and the usage rate of the chip is improved.